Technology Impact on Neutron-Induced Effects in SDRAMs : A Comparative Study

Matana Luza, Lucas; Söderström, Daniel; Pio de Mattos, Andre Martins; Bezerra, Eduardo Augusto; Cazzaniga, Carlo; Kastriotou, Maria; Poivey, Christian; Dilillo, Luigi

doi:10.1109/DTIS53253.2021.9505143

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Matana Luza, L., Söderström, D., Pio de Mattos, A. M., Bezerra, E. A., Cazzaniga, C., Kastriotou, M., Poivey, C., & Dilillo, L. (2021). Technology Impact on Neutron-Induced Effects in SDRAMs : A Comparative Study. In DTIS 2021 : Proceedings of the 16th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era. IEEE. https://doi.org/10.1109/DTIS53253.2021.9505143

Tekijät

Matana Luza, Lucas |

Söderström, Daniel |

Pio de Mattos, Andre Martins |

Bezerra, Eduardo Augusto |

Päivämäärä

2021

Tekijänoikeudet

This study analyses the response of synchronous dynamic random access memories to neutron irradiation. Three different generations of the same device with different node sizes (63, 72, and 110 nm) were characterized under an atmospheric-like neutron spectrum at the ChipIr beamline in the Rutherford Appleton Laboratories, UK. The memories were tested with a reduced refresh rate to expose more single-event upsets and under similar conditions provided by a board specifically developed for this type of study in test facilities. The board has also been designed to be used as a nanosatellite payload in order to perform similar tests. The neutron-induced failures were studied and characterized, presenting the occurrence of single-bit upsets and stuck bits. The cross sections for each type of event and technology node show that the 110 nm model is more sensitive to neutron-induced single-event effects than the other models.

Julkaisija

IEEE

Emojulkaisun ISBN

978-1-6654-3655-7

Konferenssi

IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era

Kuuluu julkaisuun

DTIS 2021 : Proceedings of the 16th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era

Rahoittaja(t)

Euroopan komissio

Rahoitusohjelmat(t)

The content of the publication reflects only the author’s view. The funder is not responsible for any use that may be made of the information it contains.

Lisätietoja rahoituksesta

This study has been achieved thanks to the ﬁnancial support of the VAN ALLEN Foundation (Contract No. UM 181387), the Region Occitanie (Contract No. UM 181386), and from the European Union’s Horizon 2020 Research and Innovation Programme under the Grant Agreement No 721624 through the RADSAGA ITN.

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