Estimating Terrestrial Neutron-Induced SEB Cross-Sections and FIT Rates for High-Voltage SiC Power MOSFETs

Ball, D. R.; Sierawski, B. D.; Galloway, K. F.; Johnson, R. A.; Alles, M. L.; Sternberg, A. L.; Witulski, A. F.; Reed, R. A.; Schrimpf, R. D.; Javanainen, Arto; Lauenstein, J-M.

doi:10.1109/TNS.2018.2885734

dc.contributor.author	Ball, D. R.
dc.contributor.author	Sierawski, B. D.
dc.contributor.author	Galloway, K. F.
dc.contributor.author	Johnson, R. A.
dc.contributor.author	Alles, M. L.
dc.contributor.author	Sternberg, A. L.
dc.contributor.author	Witulski, A. F.
dc.contributor.author	Reed, R. A.
dc.contributor.author	Schrimpf, R. D.
dc.contributor.author	Javanainen, Arto
dc.contributor.author	Lauenstein, J-M.
dc.date.accessioned	2019-12-17T13:17:00Z
dc.date.available	2019-12-17T13:17:00Z
dc.date.issued	2019
dc.identifier.citation	Ball, D. R., Sierawski, B. D., Galloway, K. F., Johnson, R. A., Alles, M. L., Sternberg, A. L., Witulski, A. F., Reed, R. A., Schrimpf, R. D., Javanainen, A., & Lauenstein, J-M. (2019). Estimating Terrestrial Neutron-Induced SEB Cross-Sections and FIT Rates for High-Voltage SiC Power MOSFETs. <i>IEEE Transactions on Nuclear Science</i>, <i>66</i>(1), 337-343. <a href="https://doi.org/10.1109/TNS.2018.2885734" target="_blank">https://doi.org/10.1109/TNS.2018.2885734</a>
dc.identifier.other	CONVID_28818479
dc.identifier.uri	https://jyx.jyu.fi/handle/123456789/66882
dc.description.abstract	Cross sections and failure in time rates for neutron-induced single-event burnout (SEB) are estimated for SiC power MOSFETs using a method based on combining results from heavy ion SEB experimental data, 3-D TCAD prediction of sensitive volumes, and Monte Carlo radiation transport simulations of secondary particle production. The results agree well with experimental data and are useful in understanding the mechanisms for neutron-induced SEB data.	fi
dc.format.mimetype	application/pdf
dc.language.iso	eng
dc.publisher	IEEE
dc.relation.ispartofseries	IEEE Transactions on Nuclear Science
dc.rights	In Copyright
dc.subject.other	silicon carbide
dc.subject.other	SiC
dc.subject.other	power
dc.subject.other	MOSFET
dc.subject.other	heavy ion
dc.subject.other	neutron
dc.subject.other	cross-section
dc.subject.other	failure in time
dc.subject.other	FIT
dc.subject.other	single event burnout
dc.subject.other	SEB
dc.subject.other	Monte Carlo
dc.subject.other	MRED
dc.title	Estimating Terrestrial Neutron-Induced SEB Cross-Sections and FIT Rates for High-Voltage SiC Power MOSFETs
dc.type	research article
dc.identifier.urn	URN:NBN:fi:jyu-201912135275
dc.contributor.laitos	Fysiikan laitos	fi
dc.contributor.laitos	Department of Physics	en
dc.contributor.oppiaine	Kiihdytinlaboratorio	fi
dc.contributor.oppiaine	Accelerator Laboratory	en
dc.type.uri	http://purl.org/eprint/type/JournalArticle
dc.date.updated	2019-12-13T13:15:05Z
dc.type.coar	http://purl.org/coar/resource_type/c_2df8fbb1
dc.description.reviewstatus	peerReviewed
dc.format.pagerange	337-343
dc.relation.issn	0018-9499
dc.relation.numberinseries	1
dc.relation.volume	66
dc.type.version	acceptedVersion
dc.rights.copyright	© 2018 IEEE
dc.rights.accesslevel	openAccess	fi
dc.type.publication	article
dc.subject.yso	säteilyfysiikka
dc.subject.yso	transistorit
dc.format.content	fulltext
jyx.subject.uri	http://www.yso.fi/onto/yso/p11069
jyx.subject.uri	http://www.yso.fi/onto/yso/p16104
dc.rights.url	http://rightsstatements.org/page/InC/1.0/?language=en
dc.relation.doi	10.1109/TNS.2018.2885734
dc.type.okm	A1

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