Estimating Terrestrial Neutron-Induced SEB Cross-Sections and FIT Rates for High-Voltage SiC Power MOSFETs

Ball, D. R.; Sierawski, B. D.; Galloway, K. F.; Johnson, R. A.; Alles, M. L.; Sternberg, A. L.; Witulski, A. F.; Reed, R. A.; Schrimpf, R. D.; Javanainen, Arto; Lauenstein, J-M.

doi:10.1109/TNS.2018.2885734

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Ball, D. R., Sierawski, B. D., Galloway, K. F., Johnson, R. A., Alles, M. L., Sternberg, A. L., Witulski, A. F., Reed, R. A., Schrimpf, R. D., Javanainen, A., & Lauenstein, J-M. (2019). Estimating Terrestrial Neutron-Induced SEB Cross-Sections and FIT Rates for High-Voltage SiC Power MOSFETs. IEEE Transactions on Nuclear Science, 66(1), 337-343. https://doi.org/10.1109/TNS.2018.2885734

Julkaistu sarjassa

IEEE Transactions on Nuclear Science

Tekijät

Ball, D. R. |

Sierawski, B. D. |

Galloway, K. F. |

Johnson, R. A. |

Alles, M. L. |

Sternberg, A. L. |

Witulski, A. F. |

Reed, R. A. |

Schrimpf, R. D. |

Javanainen, Arto |

Lauenstein, J-M.

Päivämäärä

2019

Oppiaine

Kiihdytinlaboratorio Accelerator Laboratory

Tekijänoikeudet

Cross sections and failure in time rates for neutron-induced single-event burnout (SEB) are estimated for SiC power MOSFETs using a method based on combining results from heavy ion SEB experimental data, 3-D TCAD prediction of sensitive volumes, and Monte Carlo radiation transport simulations of secondary particle production. The results agree well with experimental data and are useful in understanding the mechanisms for neutron-induced SEB data.

Julkaisija

IEEE

ISSN Hae Julkaisufoorumista

0018-9499

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