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Prediction of single-event upset rate in semi-conductor devices using the space radiation software

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Authors
Verronen, Pekka
Date
1997
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This material has a restricted access due to copyright reasons. It can be read at the workstation at Jyväskylä University Library reserved for the use of archival materials: https://kirjasto.jyu.fi/collections/archival-workstation.
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This publication is copyrighted. You may download, display and print it for Your own personal use. Commercial use is prohibited.

 
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http://urn.fi/URN:NBN:fi:jyu-202411067009

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