Elastic recoil and scattering yields measured in low energy heavy ion ERD
Kivekäs, M., Mizohata, K., Julin, J., Kainlauri, M., Prunnila, M., Keränen, L., Putkonen, M., Korkiamäki, T., & Laitinen, M. (2024). Elastic recoil and scattering yields measured in low energy heavy ion ERD. Nuclear Instruments and Methods in Physics Research. Section B : Beam Interactions with Materials and Atoms, 557, Article 165542. https://doi.org/10.1016/j.nimb.2024.165542
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Nuclear Instruments and Methods in Physics Research. Section B : Beam Interactions with Materials and AtomsAuthors
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2024Copyright
© 2024 The Authors. Published by Elsevier B.V.
Experimental yields of low energy recoils and scattered beams in ToF-ERD have been measured and compared against theory. A significant discrepancy between Rutherford or Andersen cross-section predicted yield vs the experimental results is now demonstrated. Scale of the discrepancy is up to 50% compared to yields predicted by theory for low energy Au recoils. MCERD simulations were used to study the carbon foil scattering in the timing detectors to explain the observed discrepancy. Simulations indicate that a major part of the discrepancy occurs due to the scattering of low energy, heavy mass particles in the timing detector foils. The yield discrepancy can be narrowed down by taking into account the reduction of recoil yields caused by the carbon foil scattering. Further studies are in progress to study carbon foil scattering, aiming to further improve the quantitativity of ToF-ERD for the heavy elements.
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Research costs of Academy Research Fellow, AoF; Academy Research Fellow, AoFAdditional information about funding
This work had been funded by the Academy of Finland’s Academy Research Fellow grant No. 330283, 336354 and 358145. The use of ALD center Finland research infrastructure and funding from the Academy of Finland by the profiling action on Matter and Materials, grant no. 318913. Jane and Aatos Erkko Foundation, Finland funding are acknowledged (Project: Novel materials for energy efficient microelectronics). ...License
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