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• Time-of-flight - Energy spectrometer for elemental depth profiling - Jyväskylä design 

  Laitinen, Mikko; Rossi, Mikko; Julin, Jaakko; Sajavaara, Timo (Elsevier BV, 2014)

  A new time-of-flight elastic recoil detection spectrometer has been built, and initially the main effort was focused in getting good timing resolution and high detection efficiency for light elements. With the ready system, ...

• A time-of-flight correction procedure for fast-timing data of recoils with varying implantation positions at a spectrometer focal plane 

  Mallaburn, M.J.; Singh, B.S. Nara; Cullen, D. M.; Hodge, D.; Taylor, M.J.; Giles, M.M.; Barber, L.; Niţă, C.R.; Mihai, R.E.; Mihai, C.; Mărginean, R.; Mărginean, N.; Nobs, C.R.; Gamba, E.R.; Bruce, A.M.; Scholey, Catherine; Rahkila, Panu; Greenlees, Paul; Badran, Hussam; Grahn, Tuomas; Neuvonen, O.; Auranen, Kalle; Bisso, F.; Cox, Daniel; Herzan, Andrej; Julin, Rauno; Konki, Joonas; Lightfoot, A.K.; Pakarinen, Janne; Papadakis, P.; Partanen, Jari; Sandzelius, Mikael; Sarén, Jan; Sorri, Juha; Stolze, Sanna; Uusitalo, Juha; Regan, P.H.; Podolyák, Zs.; Lalkovski, S.; Smith, J.F.; Smolen, M. (Elsevier; North-Holland, 2019)

  Fast-timing measurements at the focal plane of a separator can suffer from poor timing resolution. This is due to the variations in time-of-flight (ToF) for photons travelling to a given detector, which arise from the ...

• Depth profiling of Al2O3+ TiO2 nanolaminates by means of a time-of-flight energy spectromete 

  Laitinen, Mikko; Sajavaara, Timo; Rossi, Mikko; Julin, Jaakko; Puurunen, R.L.; Suni, T.; Ishida, T.; Fujita, H.; Arstila, K.; Brijs, B.; Whitlow, Harry (Elsevier, 2011)

  Atomic layer deposition (ALD) is currently a widespread method to grow conformal thin films with a sub-nm thickness control. By using ALD for nanolaminate oxides, it is possible to fine tune the electrical, optical and ...

• Instrumentation for time-of-flight elastic recoil detection analysis 

  Julin, Jaakko (University of Jyväskylä, 2016)

  Time-of-flight elastic recoil detection is an ion beam based method to analyze the elemental composition of thin film samples at different depths. In order to improve the mass resolution and to enable kinematic correction ...

• Digitizing data acquisition and time-of-flight pulse processing for ToF-ERDA 

  Julin, Jaakko; Sajavaara, Timo (Elsevier BV, 2016)

  A versatile system to capture and analyze signals from multi channel plate (MCP) based time-of-flight detectors and ionization based energy detectors such as silicon diodes and gas ionization chambers (GIC) is introduced. ...