Time-of-flight - Energy spectrometer for elemental depth profiling - Jyväskylä design
Laitinen, M., Rossi, M., Julin, J., & Sajavaara, T. (2014). Time-of-flight - Energy spectrometer for elemental depth profiling - Jyväskylä design. Nuclear instruments and methods in physics research section B: beam interactions with materials and atoms, 337, 55-61. doi:10.1016/j.nimb.2014.07.001
Published inNuclear instruments and methods in physics research section B: beam interactions with materials and atoms
© 2014 Elsevier B.V. This is an author's final draft version of an article whose final and definitive form has been published by Elsevier. Published in this repository with the kind permission of the publisher.
A new time-of-flight elastic recoil detection spectrometer has been built, and initially the main effort was focused in getting good timing resolution and high detection efficiency for light elements. With the ready system, a 154 ps timing resolution was recorded for scattered 4.8 MeV 4He2+ ions. The hydrogen detection efficiency was from 80% to 20% for energies from 100 keV to 1 MeV, respectively, and this was achieved by having an additional atomic layer deposited Al2O3 coating on the first timing detector’s carbon foil. The data acquisition system utilizes an FPGA-card to time-stamp every time-of-flight and energy event with 25 ns resolution. The different origins of the background events in coincident time-of-flight-energy histograms have been studied and explained. The built system has proved to be able to routinely depth profile films thinner than 10 nm.