SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below
Coronetti, A., Cecchetto, M., Wang, J., Tali, M., Fernandez Martinez, P., Kastriotou, M., Papadopoulou, A., Bilko, K., Castellani, F., Sacristan, M., Garcia Alia, R., Cazzaniga, C., Morilla, Y., Martin-Holgado, P., Van Goethem, M.-J., Kiewiet, H., Van Der Graaf, E., Brandenburg, S., Hajdas, W., . . . Puchner, H. (2020). SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below. In REDW 2020 : Workshop record of the 2020 IEEE Radiation Effects Data Workshop. IEEE. https://doi.org/10.1109/REDW51883.2020.9325822
Tekijät
Päivämäärä
2020Tekijänoikeudet
© IEEE, 2021
The R2E project at CERN has tested a few commercial SRAMs and a custom-designed SRAM, whose data are complementary to various scientific publications. The experimental data include low- and high-energy protons, heavy ions, thermal, intermediate- and high-energy neutrons, high-energy electrons and high-energy pions.
Julkaisija
IEEEEmojulkaisun ISBN
978-0-7381-1085-1Konferenssi
IEEE Radiation Effects Data WorkshopKuuluu julkaisuun
REDW 2020 : Workshop record of the 2020 IEEE Radiation Effects Data WorkshopAsiasanat
Julkaisu tutkimustietojärjestelmässä
https://converis.jyu.fi/converis/portal/detail/Publication/51400377
Metadata
Näytä kaikki kuvailutiedotKokoelmat
Rahoittaja(t)
Euroopan komissioRahoitusohjelmat(t)
Muut
The content of the publication reflects only the author’s view. The funder is not responsible for any use that may be made of the information it contains.
Lisätietoja rahoituksesta
This study has received funding from the European Union’s Horizon 2020 research and innovation programme under the MSC grant agreement no. 721624 and in part by the European Space Agency (ESA/ESTEC) at the University of Jyvaskylä under Contract 4000124504/18/NL/KML/zk.Lisenssi
Samankaltainen aineisto
Näytetään aineistoja, joilla on samankaltainen nimeke tai asiasanat.
-
Assessment of Proton Direct Ionization for the Radiation Hardness Assurance of Deep Submicron SRAMs Used in Space Applications
Coronetti, Andrea; Garcìa Alìa, Rubén; Wang, Jialei; Tali, Maris; Cecchetto, Matteo; Cazzaniga, Carlo; Javanainen, Arto; Saigné, Frédéric; Leroux, Paul (IEEE, 2021)Proton direct ionization from low-energy protons has been shown to have a potentially significant impact on the accuracy of prediction methods used to calculate the upset rates of memory devices in space applications for ... -
Proton Direct Ionization in Sub-Micron Technologies : Test Methodologies and Modelling
Lüdeke, Sascha; Cardenas, Gabriel Duran; Hajdas, Wojtek; Jaatinen, Jukka; Kettunen, Heikki; Poivey, Christian; Rossi, Mikko; Tanios, Bendy; Vogiatzi Stergiani, Marina; Javanainen, Arto (Institute of Electrical and Electronics Engineers (IEEE), 2023)Two different low energy proton (LEP) test methods, one with quasi-monoenergetic and the other with very wide proton beam energy spectra, have been studied. The two test methodologies have been applied to devices that were ... -
Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment
Söderström, Daniel; Matana Luza, Lucas; Kettunen, Heikki; Javanainen, Arto; Farabolini, Wilfrid; Gilardi, Antonio; Coronetti, Andrea; Poivey, Christian; Dilillo, Luigi (Institute of Electrical and Electronics Engineers (IEEE), 2021)This study investigates the response of synchronous dynamic random access memories to energetic electrons, and especially the possibility of electrons to cause stuck bits in these memories. Three different memories with ... -
Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random-Access Memory
Bosser, Alexandre; Gupta, V.; Javanainen, Arto; Tsiligiannis, G.; LaLumondiere, S. D.; Brewe, D.; Ferlet-Cavrois, V.; Puchner, H.; Kettunen, Heikki; Gil, T.; Wrobel, F.; Saigné, F.; Virtanen, Ari; Dilillo, L. (Institute of Electrical and Electronics Engineers, 2018)This paper identifies the failure modes of a commercial 130-nm ferroelectric random access memory. The devices were irradiated with heavy-ion and pulsed focused X-ray beams. Various failure modes are observed, which generate ... -
Single-event effects of space and atmospheric radiation on memory components
Bosser, Alexandre Louis (University of Jyväskylä, 2017)Electronic memories are ubiquitous components in electronic systems: they are used to store data, and can be found in all manner of industrial, automotive, aerospace, telecommunication and entertainment systems. Memory ...
Ellei toisin mainittu, julkisesti saatavilla olevia JYX-metatietoja (poislukien tiivistelmät) saa vapaasti uudelleenkäyttää CC0-lisenssillä.