SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below
Coronetti, A., Cecchetto, M., Wang, J., Tali, M., Fernandez Martinez, P., Kastriotou, M., Papadopoulou, A., Bilko, K., Castellani, F., Sacristan, M., Garcia Alia, R., Cazzaniga, C., Morilla, Y., Martin-Holgado, P., Van Goethem, M.-J., Kiewiet, H., Van Der Graaf, E., Brandenburg, S., Hajdas, W., . . . Puchner, H. (2020). SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below. In REDW 2020 : Workshop record of the 2020 IEEE Radiation Effects Data Workshop. IEEE. https://doi.org/10.1109/REDW51883.2020.9325822
© IEEE, 2021
The R2E project at CERN has tested a few commercial SRAMs and a custom-designed SRAM, whose data are complementary to various scientific publications. The experimental data include low- and high-energy protons, heavy ions, thermal, intermediate- and high-energy neutrons, high-energy electrons and high-energy pions.
Parent publication ISBN978-0-7381-1085-1
ConferenceIEEE Radiation Effects Data Workshop
Is part of publicationREDW 2020 : Workshop record of the 2020 IEEE Radiation Effects Data Workshop
Publication in research information system
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Related funder(s)European Commission
The content of the publication reflects only the author’s view. The funder is not responsible for any use that may be made of the information it contains.
Additional information about fundingThis study has received funding from the European Union’s Horizon 2020 research and innovation programme under the MSC grant agreement no. 721624 and in part by the European Space Agency (ESA/ESTEC) at the University of Jyvaskylä under Contract 4000124504/18/NL/KML/zk.
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