Secondary electron flight times and tracks in the carbon foil time pick-up detector
Laitinen, M., Rossi, M., Julin, J., & Sajavaara, T. (2014). Secondary electron flight times and tracks in the carbon foil time pick-up detector. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 336(October), 55-62. https://doi.org/10.1016/j.nimb.2014.06.014
Julkaistu sarjassa
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and AtomsPäivämäärä
2014Tekijänoikeudet
© 2014 Elsevier B.V. This is an author's final draft version of an article whose final and definitive form has been published by Elsevier. Published in this repository with the kind permission of the publisher.
Carbon foil time pick-up detectors used in the time-of-flight measurements of MeV energy ions have been studied in connection to time-of-flight-energy spectrometer used for heavy ion elastic recoil detection analysis. In experimental coincident TOF-E data characteristic halos are observed around light element isobars, and the origin of these halos were studied. The experimental data indicated that these halos originate from single electron events occurring before the electron multiplication in the microchannel plate. By means of electron trajectory simulations, this halo effect is explained to originate from single electron, emitted from the carbon foil, hitting the non-active area of the microchannel plate. This electron creates a secondary electron from the surface and which ends up to the microchannel plate pore, is multiplied and create now a detectable signal. Other general timing gate parameters such as wire-to-wire spacing of the grids, acceleration potential of the 1st grid and the mirror grid potential gradient were also studied in order to improve the detector performance.
...
Julkaisija
Elsevier BVISSN Hae Julkaisufoorumista
0168-583XJulkaisu tutkimustietojärjestelmässä
https://converis.jyu.fi/converis/portal/detail/Publication/23748813
Metadata
Näytä kaikki kuvailutiedotKokoelmat
Samankaltainen aineisto
Näytetään aineistoja, joilla on samankaltainen nimeke tai asiasanat.
-
Depth profiling of Al2O3+ TiO2 nanolaminates by means of a time-of-flight energy spectromete
Laitinen, Mikko; Sajavaara, Timo; Rossi, Mikko; Julin, Jaakko; Puurunen, R.L.; Suni, T.; Ishida, T.; Fujita, H.; Arstila, K.; Brijs, B.; Whitlow, Harry (Elsevier, 2011)Atomic layer deposition (ALD) is currently a widespread method to grow conformal thin films with a sub-nm thickness control. By using ALD for nanolaminate oxides, it is possible to fine tune the electrical, optical and ... -
Improvement of time-of-flight spectrometer for elastic recoil detection analysis
Laitinen Mikko (University of Jyväskylä, 2013) -
Time-of-flight - Energy spectrometer for elemental depth profiling - Jyväskylä design
Laitinen, Mikko; Rossi, Mikko; Julin, Jaakko; Sajavaara, Timo (Elsevier BV, 2014)A new time-of-flight elastic recoil detection spectrometer has been built, and initially the main effort was focused in getting good timing resolution and high detection efficiency for light elements. With the ready system, ... -
Trajectory bending and energy spreading of charged ions in time-of-flight telescopes used for ion beam analysis
Laitinen, Mikko; Sajavaara, Timo (Elsevier BV, 2014)Carbon foil time pick-up detectors are widely used in pairs in ion beam applications as time-of-flight detectors. These detectors are suitable for a wide energy range and for all ions but at the lowest energies the tandem ... -
Digitizing data acquisition and time-of-flight pulse processing for ToF-ERDA
Julin, Jaakko; Sajavaara, Timo (Elsevier BV, 2016)A versatile system to capture and analyze signals from multi channel plate (MCP) based time-of-flight detectors and ionization based energy detectors such as silicon diodes and gas ionization chambers (GIC) is introduced. ...
Ellei toisin mainittu, julkisesti saatavilla olevia JYX-metatietoja (poislukien tiivistelmät) saa vapaasti uudelleenkäyttää CC0-lisenssillä.