Mechanisms of Electron-Induced Single Event Upsets in Medical and Experimental Linacs
Tali, M., Alía, R. G., Brugger, M., Ferlet-Cavrois, V., Corsini, R., Farabolini, W., Javanainen, A., Kastriotou, M., Kettunen, H., Santin, G., Polo, C. B., Tsiligiannis, G., Danzeca, S., & Virtanen, A. (2018). Mechanisms of Electron-Induced Single Event Upsets in Medical and Experimental Linacs. IEEE Transactions on Nuclear Science, 65(8), 1715-1723. https://doi.org/10.1109/TNS.2018.2843388
Published inIEEE Transactions on Nuclear Science
© IEEE, 2018
In this paper, we perform an in-depth analysis of the single-event effects observed during testing at medical electron linacs and an experimental high-energy electron linac. For electron irradiations, the medical linacs are most commonly used due to their availability and flexibility. Whereas previous efforts were made to characterize the cross sections at higher energies, where the nuclear interaction cross section is higher, the focus of this paper is on the complete overview of relevant electron energies. Irradiations at an electron linac were made with two different devices, with a large difference in feature size. The irradiations at an experimental linac were performed with varying energies and intensities to omit other possible effects.
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Tali, Maris; Alía, Rubéen García; Brugger, Markus; Ferlet-Cavrois, Veronique; Corsini, Roberto; Farabolini, Wilfrid; Javanainen, Arto; Santin, Giovanni; Polo, Cesar Boatella; Virtanen, Ari (Institute of Electrical and Electronics Engineers, 2019)In this paper, possible mechanisms by which electrons can induce single-event latchups in electronics are discussed. The energy deposition and the nuclear fragments created by electrons in silicon are analyzed in this ...
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