Well-posed nonlinear problems in integrated circuits modeling

Abstract

In this paper we study the problem (E) + (BC) + (IC) (see below) which represents a model for integrated circuits. We assume that the distributed parametersr(x) andc(x) are nonconstant, dielectric leakages depend on thex-coordinate as well as the voltage level, while the interconnecting multiport is nonlinear and possibly multivalued.