Measurements of Low-Energy Protons using a Silicon Detector for Application to SEE Testing

Cazzaniga, Carlo; Alia, Ruben Garcia; Coronetti, Andrea; Bilko, Kacper; Morilla, Yolanda; Martin-Holgado, Pedro; Kastriotou, Maria; Frost, Christopher D.

doi:10.1109/tns.2021.3123814

dc.contributor.author	Cazzaniga, Carlo
dc.contributor.author	Alia, Ruben Garcia
dc.contributor.author	Coronetti, Andrea
dc.contributor.author	Bilko, Kacper
dc.contributor.author	Morilla, Yolanda
dc.contributor.author	Martin-Holgado, Pedro
dc.contributor.author	Kastriotou, Maria
dc.contributor.author	Frost, Christopher D.
dc.date.accessioned	2022-11-29T10:16:37Z
dc.date.available	2022-11-29T10:16:37Z
dc.date.issued	2022
dc.identifier.citation	Cazzaniga, C., Alia, R. G., Coronetti, A., Bilko, K., Morilla, Y., Martin-Holgado, P., Kastriotou, M., & Frost, C. D. (2022). Measurements of Low-Energy Protons using a Silicon Detector for Application to SEE Testing. <i>IEEE Transactions on Nuclear Science</i>, <i>69</i>(3), 485-490. <a href="https://doi.org/10.1109/tns.2021.3123814" target="_blank">https://doi.org/10.1109/tns.2021.3123814</a>
dc.identifier.other	CONVID_101719451
dc.identifier.uri	https://jyx.jyu.fi/handle/123456789/84128
dc.description.abstract	A silicon detector with a fast electronics chain is used for the dosimetry of protons in the range 0.5-5 MeV at the CNA 3 MV Tandem laboratory in Seville, Spain. In this configuration, measurements can be performed in pulsed mode, using a digitizer to record event-by-event proton energy depositions. The distributions of deposited energy were obtained thanks to a calibration with an alpha source. Measurements of flux and deposited energy are used to enable SEE testing on selected SRAMs.	en
dc.format.mimetype	application/pdf
dc.language.iso	eng
dc.publisher	IEEE
dc.relation.ispartofseries	IEEE Transactions on Nuclear Science
dc.rights	In Copyright
dc.subject.other	Low-energy protons
dc.subject.other	silicon detector
dc.subject.other	single event effects
dc.title	Measurements of Low-Energy Protons using a Silicon Detector for Application to SEE Testing
dc.type	article
dc.identifier.urn	URN:NBN:fi:jyu-202211295403
dc.contributor.laitos	Fysiikan laitos	fi
dc.contributor.laitos	Department of Physics	en
dc.type.uri	http://purl.org/eprint/type/JournalArticle
dc.type.coar	http://purl.org/coar/resource_type/c_2df8fbb1
dc.description.reviewstatus	peerReviewed
dc.format.pagerange	485-490
dc.relation.issn	0018-9499
dc.relation.numberinseries	3
dc.relation.volume	69
dc.type.version	acceptedVersion
dc.rights.copyright	© 2022, IEEE
dc.rights.accesslevel	openAccess	fi
dc.relation.grantnumber	721624
dc.relation.grantnumber	721624
dc.relation.projectid	info:eu-repo/grantAgreement/EC/H2020/721624/EU//RADSAGA
dc.subject.yso	ilmaisimet
dc.subject.yso	protonit
dc.subject.yso	pii
dc.subject.yso	dosimetrit
dc.subject.yso	säteilyfysiikka
dc.subject.yso	kalibrointi
dc.format.content	fulltext
jyx.subject.uri	http://www.yso.fi/onto/yso/p4220
jyx.subject.uri	http://www.yso.fi/onto/yso/p12428
jyx.subject.uri	http://www.yso.fi/onto/yso/p15609
jyx.subject.uri	http://www.yso.fi/onto/yso/p11056
jyx.subject.uri	http://www.yso.fi/onto/yso/p11069
jyx.subject.uri	http://www.yso.fi/onto/yso/p13931
dc.rights.url	http://rightsstatements.org/page/InC/1.0/?language=en
dc.relation.doi	10.1109/tns.2021.3123814
dc.relation.funder	European Commission	en
dc.relation.funder	Euroopan komissio	fi
jyx.fundingprogram	MSCA Innovative Training Networks (ITN)	en
jyx.fundingprogram	MSCA Innovative Training Networks (ITN)	fi
jyx.fundinginformation	This work was supported by the European Union’s Horizon 2020 Research and Innovation Programme through the Marie Sklodowska Curie Grant under Agreement 721624.
dc.type.okm	A1

Aineistoon kuuluvat tiedostot

Nimi:: publ-41 NSREC2021_protons_pape ...
Koko:: 606.5Kb
Tiedostomuoto:: PDF
Kuvaus:: acceptedVersion

Katso/Avaa

Aineisto kuuluu seuraaviin kokoelmiin

Matemaattis-luonnontieteellinen tiedekunta [5713]

Näytä suppeat kuvailutiedot

Ellei muuten mainita, aineiston lisenssi on In Copyright

Näytetään aineistoja, joilla on samankaltainen nimeke tai asiasanat.

Improved stability of black silicon detectors using aluminum oxide surface passivation

Heinonen, Juha; Haarahiltunen, Antti; Kettunen, Heikki; Jaatinen, Jukka; Rossi, Mikko; Heino, Jouni; Savin, Hele; Juntunen, Mikko A. (SPIE, 2021)

We have studied how high-energy electron irradiation (12 MeV, total dose 66 krad(Si)) and long term humidity exposure (75%, 75 ˚C, 500 hours) influence the induced junction black silicon or planar photodiode characteristics. ...
Proton Irradiation-Induced Reliability Degradation of SiC Power MOSFET

Niskanen, Kimmo; Kettunen, Heikki; Söderström, Daniel; Rossi, Mikko; Jaatinen, Jukka; Javanainen, Arto (Institute of Electrical and Electronics Engineers (IEEE), 2023)

The effect of 53 MeV proton irradiation on the reliability of silicon carbide power MOSFETs was investigated. Post-irradiation gate voltage stress was applied and early failures in time-dependent dielectric breakdown (TDDB) ...
Single Event Upsets Induced by Direct Ionization from Low-Energy Protons in Floating Gate Cells

Bagatin, Marta; Gerardin, Simone; Paccagnella, Alessandro; Visconti, Angelo; Virtanen, Ari; Kettunen, Heikki; Costantino, Alessandra; Ferlet-Cavrois, Véronique; Zadeh, Ali (IEEE, 2017)

Floating gate cells in advanced NAND Flash memories, with single-level and multi-level cell architecture, were exposed to low-energy proton beams. The first experimental evidence of single event upsets by proton direct ...
Test of JYUTube as a veto detector at MARA for background suppression in nuclear spectroscopy beyond the proton drip line

Sottili, Leandro (2018)

At JYFL-ACCLAB a Mass Analysing Recoil Apparatus (MARA) was built to per- form nuclear spectroscopy of exotic nuclei with N=Z in the region A∼80 created via fusion evaporation reactions at low energies (3-6 MeV/u). Fusion ...
Assessment of Proton Direct Ionization for the Radiation Hardness Assurance of Deep Submicron SRAMs Used in Space Applications

Coronetti, Andrea; Garcìa Alìa, Rubén; Wang, Jialei; Tali, Maris; Cecchetto, Matteo; Cazzaniga, Carlo; Javanainen, Arto; Saigné, Frédéric; Leroux, Paul (IEEE, 2021)

Proton direct ionization from low-energy protons has been shown to have a potentially significant impact on the accuracy of prediction methods used to calculate the upset rates of memory devices in space applications for ...

Measurements of Low-Energy Protons using a Silicon Detector for Application to SEE Testing

Aineistoon kuuluvat tiedostot

Aineisto kuuluu seuraaviin kokoelmiin

Samankaltainen aineisto

Improved stability of black silicon detectors using aluminum oxide surface passivation ﻿

Proton Irradiation-Induced Reliability Degradation of SiC Power MOSFET ﻿

Single Event Upsets Induced by Direct Ionization from Low-Energy Protons in Floating Gate Cells ﻿

Test of JYUTube as a veto detector at MARA for background suppression in nuclear spectroscopy beyond the proton drip line ﻿

Assessment of Proton Direct Ionization for the Radiation Hardness Assurance of Deep Submicron SRAMs Used in Space Applications ﻿

Improved stability of black silicon detectors using aluminum oxide surface passivation

Proton Irradiation-Induced Reliability Degradation of SiC Power MOSFET

Single Event Upsets Induced by Direct Ionization from Low-Energy Protons in Floating Gate Cells

Test of JYUTube as a veto detector at MARA for background suppression in nuclear spectroscopy beyond the proton drip line

Assessment of Proton Direct Ionization for the Radiation Hardness Assurance of Deep Submicron SRAMs Used in Space Applications