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dc.contributor.authorKoppinen, Panu
dc.date.accessioned2008-01-08T07:49:41Z
dc.date.available2008-01-08T07:49:41Z
dc.date.issued2003
dc.identifier.otheroai:jykdok.linneanet.fi:897782
dc.identifier.urihttps://jyx.jyu.fi/handle/123456789/8190
dc.format.extent75 lehteä.
dc.format.mimetypeapplication/pdf
dc.language.isoeng
dc.rightsIn Copyrighten
dc.subject.othertunnel junction
dc.subject.othertunneling
dc.subject.othertunneling current
dc.subject.otherelectron tunneling
dc.subject.othertemperature dependence
dc.subject.otherbias voltage dependence
dc.titleBias and temperature dependence analysis of the tunneling current of normal metal-insulator-normal metal tunnel junctions
dc.typemaster thesis
dc.identifier.urnURN:NBN:fi:jyu-2003897782
dc.type.dcmitypeTexten
dc.type.ontasotPro gradu -tutkielmafi
dc.type.ontasotMaster’s thesisen
dc.contributor.tiedekuntaMatemaattis-luonnontieteellinen tiedekuntafi
dc.contributor.tiedekuntaFaculty of Sciencesen
dc.contributor.laitosFysiikan laitosfi
dc.contributor.laitosDepartment of Physicsen
dc.contributor.yliopistoUniversity of Jyväskyläen
dc.contributor.yliopistoJyväskylän yliopistofi
dc.type.coarhttp://purl.org/coar/resource_type/c_bdcc
dc.rights.accesslevelopenAccessfi
dc.type.publicationmasterThesis
dc.contributor.oppiainekoodi402
dc.format.contentfulltext
dc.rights.urlhttps://rightsstatements.org/page/InC/1.0/
dc.type.okmG2


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