Showing items with similar title or keywords.

• Delay line design for high-resolution time-to-digital converters 

  Khoruzhenko, Olha (2024)

  Microelectronic technology is constantly scaling towards more modern, advanced, smaller technology nodes, which allows higher operational speeds and more robustness to total ionising dose. However, the technology downscaling ...

• Nanorod orientation control by swift heavy ion irradiation 

  Korkos, Spyridon; Jantunen, Ville; Arstila, Kai; Sajavaara, Timo; Leino, Aleksi; Nordlund, Kai; Djurabekova, Flyura (AIP Publishing, 2022)

  Highly energetic ions have been previously used to modify the shape of metal nanoparticles embedded in an insulating matrix. In this work, we demonstrate that under suitable conditions, energetic ions can be used not only ...

• Assessment of Proton Direct Ionization for the Radiation Hardness Assurance of Deep Submicron SRAMs Used in Space Applications 

  Coronetti, Andrea; Garcìa Alìa, Rubén; Wang, Jialei; Tali, Maris; Cecchetto, Matteo; Cazzaniga, Carlo; Javanainen, Arto; Saigné, Frédéric; Leroux, Paul (IEEE, 2021)

  Proton direct ionization from low-energy protons has been shown to have a potentially significant impact on the accuracy of prediction methods used to calculate the upset rates of memory devices in space applications for ...

• Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment 

  Söderström, Daniel; Matana Luza, Lucas; Kettunen, Heikki; Javanainen, Arto; Farabolini, Wilfrid; Gilardi, Antonio; Coronetti, Andrea; Poivey, Christian; Dilillo, Luigi (Institute of Electrical and Electronics Engineers (IEEE), 2021)

  This study investigates the response of synchronous dynamic random access memories to energetic electrons, and especially the possibility of electrons to cause stuck bits in these memories. Three different memories with ...

• Low-Power, Subthreshold Reference Circuits for the Space Environment : Evaluated with γ-rays, X-rays, Protons and Heavy Ions 

  Andreou, Charalambos M.; González-Castaño, Diego Miguel; Gerardin, Simone; Bagatin, Marta; Rodriguez, Faustino Gómez; Paccagnella, Alessandro; Prokofiev, Alexander V.; Javanainen, Arto; Virtanen, Ari; Liberali, Valentino; Calligaro, Cristiano; Nahmad, Daniel; Georgiou, Julius (MDPI AG, 2019)

  The radiation tolerance of subthreshold reference circuits for space microelectronics is presented. The assessment is supported by measured results of total ionization dose and single event transient radiation-induced ...