Methodologies for the Statistical Analysis of Memory Response to Radiation
Bosser, A., Gupta, V., Tsiligiannis, G., Frost, C. D., Zadeh, A., Jaatinen, J., Javanainen, A., Puchner, H., Saigné, F., Virtanen, A., Wrobel, F., & Dilillo, L. (2016). Methodologies for the Statistical Analysis of Memory Response to Radiation. IEEE Transactions on Nuclear Science, 63(4), 2122-2128. https://doi.org/10.1109/TNS.2016.2527781
Published in
IEEE Transactions on Nuclear ScienceDate
2016Copyright
© 2016 IEEE. This is a final draft version of an article whose final and definitive form has been published in the conference proceeding by IEEE. Published in this repository with the kind permission of the publisher.
Methodologies are proposed for in-depth
statistical analysis of Single Event Upset data. The
motivation for using these methodologies is to obtain
precise information on the intrinsic defects and weaknesses
of the tested devices, and to gain insight on their failure
mechanisms, at no additional cost. The case study is a
65nm SRAM irradiated with neutrons, protons and heavyions.
Publisher
Institute of Electrical and Electronics EngineersISSN Search the Publication Forum
0018-9499Keywords
Publication in research information system
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