Methodologies for the Statistical Analysis of Memory Response to Radiation
Bosser, A., Gupta, V., Tsiligiannis, G., Frost, C. D., Zadeh, A., Jaatinen, J., Javanainen, A., Puchner, H., Saigné, F., Virtanen, A., Wrobel, F., & Dilillo, L. (2016). Methodologies for the Statistical Analysis of Memory Response to Radiation. IEEE Transactions on Nuclear Science, 63(4), 2122-2128. https://doi.org/10.1109/TNS.2016.2527781
Published inIEEE Transactions on Nuclear Science
© 2016 IEEE. This is a final draft version of an article whose final and definitive form has been published in the conference proceeding by IEEE. Published in this repository with the kind permission of the publisher.
Methodologies are proposed for in-depth statistical analysis of Single Event Upset data. The motivation for using these methodologies is to obtain precise information on the intrinsic defects and weaknesses of the tested devices, and to gain insight on their failure mechanisms, at no additional cost. The case study is a 65nm SRAM irradiated with neutrons, protons and heavyions.
PublisherInstitute of Electrical and Electronics Engineers
ISSN Search the Publication Forum0018-9499
Publication in research information system
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