| dc.contributor.author | Bosser, Alexandre | |
| dc.contributor.author | Gupta, Viyas | |
| dc.contributor.author | Tsiligiannis, Georgios | |
| dc.contributor.author | Frost, Christopher D. | |
| dc.contributor.author | Zadeh, Ali | |
| dc.contributor.author | Jaatinen, Jukka | |
| dc.contributor.author | Javanainen, Arto | |
| dc.contributor.author | Puchner, Helmut | |
| dc.contributor.author | Saigné, Frédéric | |
| dc.contributor.author | Virtanen, Ari | |
| dc.contributor.author | Wrobel, Frédéric | |
| dc.contributor.author | Dilillo, Luigi | |
| dc.date.accessioned | 2016-08-29T05:42:22Z | |
| dc.date.available | 2016-08-29T05:42:22Z | |
| dc.date.issued | 2016 | |
| dc.identifier.citation | Bosser, A., Gupta, V., Tsiligiannis, G., Frost, C. D., Zadeh, A., Jaatinen, J., Javanainen, A., Puchner, H., Saigné, F., Virtanen, A., Wrobel, F., & Dilillo, L. (2016). Methodologies for the Statistical Analysis of Memory Response to Radiation. <i>IEEE Transactions on Nuclear Science</i>, <i>63</i>(4), 2122-2128. <a href="https://doi.org/10.1109/TNS.2016.2527781" target="_blank">https://doi.org/10.1109/TNS.2016.2527781</a> | |
| dc.identifier.other | CONVID_26125029 | |
| dc.identifier.other | TUTKAID_70697 | |
| dc.identifier.uri | https://jyx.jyu.fi/handle/123456789/51096 | |
| dc.description.abstract | Methodologies are proposed for in-depth
statistical analysis of Single Event Upset data. The
motivation for using these methodologies is to obtain
precise information on the intrinsic defects and weaknesses
of the tested devices, and to gain insight on their failure
mechanisms, at no additional cost. The case study is a
65nm SRAM irradiated with neutrons, protons and heavyions. | |
| dc.language.iso | eng | |
| dc.publisher | Institute of Electrical and Electronics Engineers | |
| dc.relation.ispartofseries | IEEE Transactions on Nuclear Science | |
| dc.subject.other | memory response | |
| dc.subject.other | statistical analysis | |
| dc.title | Methodologies for the Statistical Analysis of Memory Response to Radiation | |
| dc.type | article | |
| dc.identifier.urn | URN:NBN:fi:jyu-201608263890 | |
| dc.contributor.laitos | Fysiikan laitos | fi |
| dc.contributor.laitos | Department of Physics | en |
| dc.contributor.oppiaine | Kiihdytinlaboratorio | fi |
| dc.contributor.oppiaine | Accelerator Laboratory | en |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | |
| dc.date.updated | 2016-08-26T12:15:05Z | |
| dc.type.coar | http://purl.org/coar/resource_type/c_2df8fbb1 | |
| dc.description.reviewstatus | peerReviewed | |
| dc.format.pagerange | 2122-2128 | |
| dc.relation.issn | 0018-9499 | |
| dc.relation.numberinseries | 4 | |
| dc.relation.volume | 63 | |
| dc.type.version | acceptedVersion | |
| dc.rights.copyright | © 2016 IEEE. This is a final draft version of an article whose final and definitive form has been published in the conference proceeding by IEEE. Published in this repository with the kind permission of the publisher. | |
| dc.rights.accesslevel | openAccess | fi |
| dc.subject.yso | säteily | |
| jyx.subject.uri | http://www.yso.fi/onto/yso/p4150 | |
| dc.relation.doi | 10.1109/TNS.2016.2527781 | |
| dc.type.okm | A1 | |
