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dc.contributor.authorKoivistoinen, Juha
dc.contributor.authorAumanen, Jukka
dc.contributor.authorHiltunen, Vesa-Matti
dc.contributor.authorMyllyperkiö, Pasi
dc.contributor.authorJohansson, Andreas
dc.contributor.authorPettersson, Mika
dc.date.accessioned2016-06-03T10:28:05Z
dc.date.available2017-04-15T21:45:05Z
dc.date.issued2016
dc.identifier.citationKoivistoinen, J., Aumanen, J., Hiltunen, V.-M., Myllyperkiö, P., Johansson, A., & Pettersson, M. (2016). Real-time monitoring of graphene patterning with wide-field four-wave mixing microscopy. <i>Applied Physics Letters</i>, <i>108</i>(15), Article 153112. <a href="https://doi.org/10.1063/1.4946854" target="_blank">https://doi.org/10.1063/1.4946854</a>
dc.identifier.otherCONVID_25705316
dc.identifier.otherTUTKAID_70027
dc.identifier.urihttps://jyx.jyu.fi/handle/123456789/50093
dc.description.abstractThe single atom thick two-dimensional graphene is a promising material for various applications due to its extraordinary electronic, optical, optoelectronic, and mechanical properties. The demand for developing graphene based applications has entailed a requirement for development of methods for fast imaging techniques for graphene. Here, we demonstrate imaging of graphene with femtosecond wide-field four-wave mixing microscopy. The method provides a sensitive, non-destructive approach for rapid large area characterization of graphene. We show that the method is suitable for online following of a laser patterning process of microscale structures on single-layer graphene.
dc.language.isoeng
dc.publisherAmerican Institute of Physics
dc.relation.ispartofseriesApplied Physics Letters
dc.subject.otherfour-wave mixing microscopy
dc.titleReal-time monitoring of graphene patterning with wide-field four-wave mixing microscopy
dc.typearticle
dc.identifier.urnURN:NBN:fi:jyu-201606032844
dc.contributor.laitosFysiikan laitosfi
dc.contributor.laitosKemian laitosfi
dc.contributor.laitosDepartment of Physicsen
dc.contributor.laitosDepartment of Chemistryen
dc.contributor.oppiaineFysikaalinen kemiafi
dc.contributor.oppiaineNanoscience Centerfi
dc.contributor.oppiainePhysical Chemistryen
dc.contributor.oppiaineNanoscience Centeren
dc.type.urihttp://purl.org/eprint/type/JournalArticle
dc.date.updated2016-06-03T09:15:16Z
dc.type.coarjournal article
dc.description.reviewstatuspeerReviewed
dc.relation.issn0003-6951
dc.relation.numberinseries15
dc.relation.volume108
dc.type.versionpublishedVersion
dc.rights.copyright© Published by AIP Publishing. Published in this repository with the kind permission of the publisher.
dc.rights.accesslevelopenAccessfi
dc.subject.ysografeeni
jyx.subject.urihttp://www.yso.fi/onto/yso/p24483
dc.relation.doi10.1063/1.4946854


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