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Real-time monitoring of graphene patterning with wide-field four-wave mixing microscopy

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Koivistoinen, J., Aumanen, J., Hiltunen, V.-M., Myllyperkiö, P., Johansson, A., & Pettersson, M. (2016). Real-time monitoring of graphene patterning with wide-field four-wave mixing microscopy. Applied Physics Letters, 108(15), Article 153112. https://doi.org/10.1063/1.4946854
Published in
Applied Physics Letters
Authors
Koivistoinen, Juha |
Aumanen, Jukka |
Hiltunen, Vesa-Matti |
Myllyperkiö, Pasi |
Johansson, Andreas |
Pettersson, Mika
Date
2016
Discipline
Fysikaalinen kemiaNanoscience CenterPhysical ChemistryNanoscience Center
Copyright
© Published by AIP Publishing. Published in this repository with the kind permission of the publisher.

 
The single atom thick two-dimensional graphene is a promising material for various applications due to its extraordinary electronic, optical, optoelectronic, and mechanical properties. The demand for developing graphene based applications has entailed a requirement for development of methods for fast imaging techniques for graphene. Here, we demonstrate imaging of graphene with femtosecond wide-field four-wave mixing microscopy. The method provides a sensitive, non-destructive approach for rapid large area characterization of graphene. We show that the method is suitable for online following of a laser patterning process of microscale structures on single-layer graphene.
Publisher
American Institute of Physics
ISSN Search the Publication Forum
0003-6951
Keywords
four-wave mixing microscopy grafeeni
DOI
https://doi.org/10.1063/1.4946854
URI

http://urn.fi/URN:NBN:fi:jyu-201606032844

Publication in research information system

https://converis.jyu.fi/converis/portal/detail/Publication/25705316

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