Real-time monitoring of graphene patterning with wide-field four-wave mixing microscopy
Koivistoinen, J., Aumanen, J., Hiltunen, V.-M., Myllyperkiö, P., Johansson, A., & Pettersson, M. (2016). Real-time monitoring of graphene patterning with wide-field four-wave mixing microscopy. Applied Physics Letters, 108 (15), 153112. doi:10.1063/1.4946854
Published in
Applied Physics LettersAuthors
Date
2016Discipline
Fysikaalinen kemiaCopyright
© Published by AIP Publishing. Published in this repository with the kind permission of the publisher.
The single atom thick two-dimensional graphene is a promising material for various applications
due to its extraordinary electronic, optical, optoelectronic, and mechanical properties. The demand
for developing graphene based applications has entailed a requirement for development of methods
for fast imaging techniques for graphene. Here, we demonstrate imaging of graphene with femtosecond
wide-field four-wave mixing microscopy. The method provides a sensitive, non-destructive
approach for rapid large area characterization of graphene. We show that the method is suitable for
online following of a laser patterning process of microscale structures on single-layer graphene.