Real-time monitoring of graphene patterning with wide-field four-wave mixing microscopy
Abstract
The single atom thick two-dimensional graphene is a promising material for various applications
due to its extraordinary electronic, optical, optoelectronic, and mechanical properties. The demand
for developing graphene based applications has entailed a requirement for development of methods
for fast imaging techniques for graphene. Here, we demonstrate imaging of graphene with femtosecond
wide-field four-wave mixing microscopy. The method provides a sensitive, non-destructive
approach for rapid large area characterization of graphene. We show that the method is suitable for
online following of a laser patterning process of microscale structures on single-layer graphene.
Main Authors
Format
Articles
Research article
Published
2016
Series
Subjects
Publication in research information system
Publisher
American Institute of Physics
The permanent address of the publication
https://urn.fi/URN:NBN:fi:jyu-201606032844Käytä tätä linkitykseen.
Review status
Peer reviewed
ISSN
0003-6951
DOI
https://doi.org/10.1063/1.4946854
Language
English
Published in
Applied Physics Letters
Citation
- Koivistoinen, J., Aumanen, J., Hiltunen, V.-M., Myllyperkiö, P., Johansson, A., & Pettersson, M. (2016). Real-time monitoring of graphene patterning with wide-field four-wave mixing microscopy. Applied Physics Letters, 108(15), Article 153112. https://doi.org/10.1063/1.4946854
License
Copyright© Published by AIP Publishing. Published in this repository with the kind permission of the publisher.