Improvement of time-of-flight spectrometer for elastic recoil detection analysis

Laitinen Mikko

dc.contributor.author	Laitinen Mikko
dc.date.accessioned	2014-02-13T12:33:28Z
dc.date.available	2014-02-13T12:33:28Z
dc.date.issued	2013
dc.identifier.isbn	978-951-39-5547-2
dc.identifier.other	oai:jykdok.linneanet.fi:1308463
dc.identifier.uri	https://jyx.jyu.fi/handle/123456789/42953
dc.format.extent	Verkkoaineisto 68 sivua
dc.language.iso	eng
dc.publisher	University of Jyväskylä
dc.relation.ispartofseries	Research report / Department of Physics, University of Jyväskylä
dc.rights	In Copyright
dc.subject.other	time of flight elastic recoil detection analysis
dc.subject.other	ToF-ERDA
dc.subject.other	time-of flight
dc.subject.other	ToF
dc.subject.other	timing gate
dc.subject.other	elemental depth profiling
dc.title	Improvement of time-of-flight spectrometer for elastic recoil detection analysis
dc.type	Diss.
dc.identifier.urn	URN:ISBN:978-951-39-5547-2
dc.type.dcmitype	Text	en
dc.type.ontasot	Väitöskirja	fi
dc.type.ontasot	Doctoral dissertation	en
dc.contributor.tiedekunta	Matemaattis-luonnontieteellinen tiedekunta	fi
dc.contributor.tiedekunta	Faculty of Mathematics and Science	en
dc.contributor.yliopisto	University of Jyväskylä	en
dc.contributor.yliopisto	Jyväskylän yliopisto	fi
dc.contributor.oppiaine	Fysiikka	fi
dc.relation.issn	0075-465X
dc.relation.numberinseries	no. 12/2013
dc.rights.accesslevel	openAccess
dc.subject.yso	spektrometrit
dc.rights.url	https://rightsstatements.org/page/InC/1.0/

Aineistoon kuuluvat tiedostot

Nimi:: 978-951-39-5547-2.pdf
Koko:: 6.724Mb
Tiedostomuoto:: PDF

Katso/Avaa

Aineisto kuuluu seuraaviin kokoelmiin

Väitöskirjat [3559]

Näytä suppeat kuvailutiedot

Ellei muuten mainita, aineiston lisenssi on In Copyright

Näytetään aineistoja, joilla on samankaltainen nimeke tai asiasanat.

Time-of-flight - Energy spectrometer for elemental depth profiling - Jyväskylä design

Laitinen, Mikko; Rossi, Mikko; Julin, Jaakko; Sajavaara, Timo (Elsevier BV, 2014)

A new time-of-flight elastic recoil detection spectrometer has been built, and initially the main effort was focused in getting good timing resolution and high detection efficiency for light elements. With the ready system, ...
A time-of-flight correction procedure for fast-timing data of recoils with varying implantation positions at a spectrometer focal plane

Mallaburn, M.J.; Singh, B.S. Nara; Cullen, D. M.; Hodge, D.; Taylor, M.J.; Giles, M.M.; Barber, L.; Niţă, C.R.; Mihai, R.E.; Mihai, C.; Mărginean, R.; Mărginean, N.; Nobs, C.R.; Gamba, E.R.; Bruce, A.M.; Scholey, Catherine; Rahkila, Panu; Greenlees, Paul; Badran, Hussam; Grahn, Tuomas; Neuvonen, O.; Auranen, Kalle; Bisso, F.; Cox, Daniel; Herzan, Andrej; Julin, Rauno; Konki, Joonas; Lightfoot, A.K.; Pakarinen, Janne; Papadakis, P.; Partanen, Jari; Sandzelius, Mikael; Sarén, Jan; Sorri, Juha; Stolze, Sanna; Uusitalo, Juha; Regan, P.H.; Podolyák, Zs.; Lalkovski, S.; Smith, J.F.; Smolen, M. (Elsevier; North-Holland, 2019)

Fast-timing measurements at the focal plane of a separator can suffer from poor timing resolution. This is due to the variations in time-of-flight (ToF) for photons travelling to a given detector, which arise from the ...
Depth profiling of Al2O3+ TiO2 nanolaminates by means of a time-of-flight energy spectromete

Laitinen, Mikko; Sajavaara, Timo; Rossi, Mikko; Julin, Jaakko; Puurunen, R.L.; Suni, T.; Ishida, T.; Fujita, H.; Arstila, K.; Brijs, B.; Whitlow, Harry (Elsevier, 2011)

Atomic layer deposition (ALD) is currently a widespread method to grow conformal thin films with a sub-nm thickness control. By using ALD for nanolaminate oxides, it is possible to fine tune the electrical, optical and ...
Instrumentation for time-of-flight elastic recoil detection analysis

Julin, Jaakko (University of Jyväskylä, 2016)

Time-of-ﬂight elastic recoil detection is an ion beam based method to analyze the elemental composition of thin ﬁlm samples at different depths. In order to improve the mass resolution and to enable kinematic correction ...
Digitizing data acquisition and time-of-flight pulse processing for ToF-ERDA

Julin, Jaakko; Sajavaara, Timo (Elsevier BV, 2016)

A versatile system to capture and analyze signals from multi channel plate (MCP) based time-of-flight detectors and ionization based energy detectors such as silicon diodes and gas ionization chambers (GIC) is introduced. ...

Improvement of time-of-flight spectrometer for elastic recoil detection analysis

Aineistoon kuuluvat tiedostot

Aineisto kuuluu seuraaviin kokoelmiin

Samankaltainen aineisto

Time-of-flight - Energy spectrometer for elemental depth profiling - Jyväskylä design ﻿

A time-of-flight correction procedure for fast-timing data of recoils with varying implantation positions at a spectrometer focal plane ﻿

Depth profiling of Al2O3+ TiO2 nanolaminates by means of a time-of-flight energy spectromete ﻿

Instrumentation for time-of-flight elastic recoil detection analysis ﻿

Digitizing data acquisition and time-of-flight pulse processing for ToF-ERDA ﻿

Time-of-flight - Energy spectrometer for elemental depth profiling - Jyväskylä design

A time-of-flight correction procedure for fast-timing data of recoils with varying implantation positions at a spectrometer focal plane

Depth profiling of Al2O3+ TiO2 nanolaminates by means of a time-of-flight energy spectromete

Instrumentation for time-of-flight elastic recoil detection analysis

Digitizing data acquisition and time-of-flight pulse processing for ToF-ERDA