Experimental evidence on photo-assisted O− ion production from Al2O3 cathode in cesium sputter negative ion source
Tarvainen, O., Kronholm, R., Laitinen, M., Reponen, M., Julin, J., Toivanen, V., Napari, M., Marttinen, M., Faircloth, D., Koivisto, H., & Sajavaara, T. (2020). Experimental evidence on photo-assisted O− ion production from Al2O3 cathode in cesium sputter negative ion source. Journal of Applied Physics, 128(9), Article 094903. https://doi.org/10.1063/5.0020751
Published in
Journal of Applied PhysicsAuthors
Date
2020Copyright
© 2020 the Authors
The production of negative ions in cesium sputter ion sources is generally considered to be a pure surface process. It has been recently proposed that ion pair production could explain the higher-than-expected beam currents extracted from these ion sources, therefore opening the door for laser-assisted enhancement of the negative ion yield. We have tested this hypothesis by measuring the effect of various pulsed diode lasers on the O− beam current produced from Al2O3 cathode of a cesium sputter ion source. It is expected that the ion pair production of O− requires populating the 5d electronic states of neutral cesium, thus implying that the process should be provoked only with specific wavelengths. Our experimental results provide evidence for the existence of a wavelength-dependent photo-assisted effect but cast doubt on its alleged resonant nature as the prompt enhancement of beam current can be observed with laser wavelengths exceeding a threshold photon energy. The beam current transients observed during the laser pulses suggest that the magnitude and longevity of the beam current enhancement depends on the cesium balance on the cathode surface. We conclude that the photo-assisted negative ion production could be of practical importance as it can more than double the extracted beam current under certain operational settings of the ion source.
...


Publisher
AIP PublishingISSN Search the Publication Forum
0021-8979Keywords
Publication in research information system
https://converis.jyu.fi/converis/portal/detail/Publication/41939905
Metadata
Show full item recordCollections
Additional information about funding
M.N. acknowledges financial support from Her Majesty’s Customs & Revenues (HMCR) Coronavirus Job Retention Scheme.License
Related items
Showing items with similar title or keywords.
-
Photo-assisted O− and Al− production with a cesium sputter ion source
Tarvainen, Olli; Kronholm, Risto; Laitinen, Mikko; Reponen, Mikael; Julin ,Jaakko; Toivanen, Ville; Napari, Mari; Marttinen, Miha; Kalvas, Taneli; Faircloth, Dan; Koivisto, Hannu; Sajavaara, Timo (American Institute of Physics, 2021)It has been recently proposed that the production of negative ions with cesium sputter ion sources could be enhanced by laser-assisted resonant ion pair production. We have tested this hypothesis by measuring the effect ... -
Mechanisms of Electron-Induced Single Event Upsets in Medical and Experimental Linacs
Tali, Maris; Alía, Rubéen García; Brugger, Markus; Ferlet-Cavrois, Veronique; Corsini, Roberto; Farabolini, Wilfrid; Javanainen, Arto; Kastriotou, Maria; Kettunen, Heikki; Santin, Giovanni; Polo, Cesar Boatella; Tsiligiannis, Georgios; Danzeca, Salvatore; Virtanen, Ari (IEEE, 2018)In this paper, we perform an in-depth analysis of the single-event effects observed during testing at medical electron linacs and an experimental high-energy electron linac. For electron irradiations, the medical linacs ... -
Photo-enhanced O−, H− and Br− ion production in caesium sputter negative ion source : no evidence for resonant ion pair production
Hossain, Akbar; Tarvainen, Olli; Reponen, Mikael; Kronholm, Risto; Julin, Jaakko; Kalvas, Taneli; Toivanen, Ville; Kivekäs, Mikko; Laitinen, Mikko (IOP Publishing, 2022)It has been proposed that the negative ion yield of a caesium sputter ion source could be enhanced by promoting neutral caesium atoms to electronically excited 7p states supporting resonant ion pair production. We have ... -
Mechanisms of Electron-Induced Single Event Latchup
Tali, Maris; Alía, Rubéen García; Brugger, Markus; Ferlet-Cavrois, Veronique; Corsini, Roberto; Farabolini, Wilfrid; Javanainen, Arto; Santin, Giovanni; Polo, Cesar Boatella; Virtanen, Ari (Institute of Electrical and Electronics Engineers, 2019)In this paper, possible mechanisms by which electrons can induce single-event latchups in electronics are discussed. The energy deposition and the nuclear fragments created by electrons in silicon are analyzed in this ... -
High-accuracy mass spectrometry of fission products with Penning traps
Kankainen, Anu; Äystö, Juha; Jokinen, Ari (Institute of Physics, 2012)Mass measurements of fission products based on Penning-trap technique are reviewed in this article. More than 300 fission products have been measured with JYFLTRAP, ISOLTRAP, CPT, LEBIT and TITAN Penning traps with a typical ...