dc.contributor.author | Ahlskog, Markus | |
dc.contributor.author | Hokkanen, Matti J. | |
dc.contributor.author | Levshov, Dmitry | |
dc.contributor.author | Svensson, Krister | |
dc.contributor.author | Volodin, Alexander | |
dc.contributor.author | van Haesendonck, Chris | |
dc.date.accessioned | 2020-07-03T11:11:26Z | |
dc.date.available | 2020-07-03T11:11:26Z | |
dc.date.issued | 2020 | |
dc.identifier.citation | Ahlskog, M., Hokkanen, M. J., Levshov, D., Svensson, K., Volodin, A., & van Haesendonck, C. (2020). Individual arc-discharge synthesized multiwalled carbon nanotubes probed with multiple measurement techniques. <i>Journal of Vacuum Science and Technology. Part B. Nanotechnology and Microelectronics</i>, <i>38</i>(4), Article 042804. <a href="https://doi.org/10.1116/6.0000187" target="_blank">https://doi.org/10.1116/6.0000187</a> | |
dc.identifier.other | CONVID_36259734 | |
dc.identifier.uri | https://jyx.jyu.fi/handle/123456789/71056 | |
dc.description.abstract | Arc-discharge synthesized multiwalled carbon nanotubes (AD-MWNT), or related MWNTs, exhibit a good quality compared to the more common type of MWNT synthesized by catalytic chemical vapor deposition methods. Yet experimental measurements on these are rather few and typically have not correlated data from different measurement techniques. Here, the authors report Raman spectroscopy, scanning probe microscopy, conductivity measurements, and force microscopy on single AD-MWNTs. The results demonstrate the high quality of AD-MWNTs and are compatible with the view of them as the best approximation of MWNTs as an assembly of defect-free concentric individual single-walled carbon nanotubes. The authors also demonstrate conductance measurements over a step on the surface of an AD-MWNT, which is due to an abruptly broken outer layer(s), whereby the interlayer resistance is measured. | en |
dc.format.mimetype | application/pdf | |
dc.language | eng | |
dc.language.iso | eng | |
dc.publisher | American Institute of Physics | |
dc.relation.ispartofseries | Journal of Vacuum Science and Technology. Part B. Nanotechnology and Microelectronics | |
dc.rights | In Copyright | |
dc.subject.other | electronic devices | |
dc.subject.other | scanning tunneling microscopy | |
dc.subject.other | scanning probe microscopy | |
dc.subject.other | scanning electron microscopy | |
dc.subject.other | electric discharges | |
dc.subject.other | atomic force microscopy | |
dc.subject.other | raman spectroscopy | |
dc.subject.other | nanotubes | |
dc.title | Individual arc-discharge synthesized multiwalled carbon nanotubes probed with multiple measurement techniques | |
dc.type | article | |
dc.identifier.urn | URN:NBN:fi:jyu-202007035231 | |
dc.contributor.laitos | Fysiikan laitos | fi |
dc.contributor.laitos | Department of Physics | en |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | |
dc.description.reviewstatus | peerReviewed | |
dc.relation.issn | 2166-2746 | |
dc.relation.numberinseries | 4 | |
dc.relation.volume | 38 | |
dc.type.version | publishedVersion | |
dc.rights.copyright | © 2020 Author(s). | |
dc.rights.accesslevel | openAccess | fi |
dc.subject.yso | atomivoimamikroskopia | |
dc.subject.yso | nanoputket | |
dc.subject.yso | atomifysiikka | |
dc.format.content | fulltext | |
jyx.subject.uri | http://www.yso.fi/onto/yso/p38648 | |
jyx.subject.uri | http://www.yso.fi/onto/yso/p25661 | |
jyx.subject.uri | http://www.yso.fi/onto/yso/p16034 | |
dc.rights.url | http://rightsstatements.org/page/InC/1.0/?language=en | |
dc.relation.doi | 10.1116/6.0000187 | |
jyx.fundinginformation | M.A. acknowledges the Academy of Finland for financial support. D.L. acknowledges financial support from the Russian Foundation for Basic Research (Grant No. 18-29-19043 mk). | |