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dc.contributor.authorAhlskog, Markus
dc.contributor.authorHokkanen, Matti J.
dc.contributor.authorLevshov, Dmitry
dc.contributor.authorSvensson, Krister
dc.contributor.authorVolodin, Alexander
dc.contributor.authorvan Haesendonck, Chris
dc.date.accessioned2020-07-03T11:11:26Z
dc.date.available2020-07-03T11:11:26Z
dc.date.issued2020
dc.identifier.citationAhlskog, M., Hokkanen, M. J., Levshov, D., Svensson, K., Volodin, A., & van Haesendonck, C. (2020). Individual arc-discharge synthesized multiwalled carbon nanotubes probed with multiple measurement techniques. <i>Journal of Vacuum Science and Technology. Part B. Nanotechnology and Microelectronics</i>, <i>38</i>(4), Article 042804. <a href="https://doi.org/10.1116/6.0000187" target="_blank">https://doi.org/10.1116/6.0000187</a>
dc.identifier.otherCONVID_36259734
dc.identifier.urihttps://jyx.jyu.fi/handle/123456789/71056
dc.description.abstractArc-discharge synthesized multiwalled carbon nanotubes (AD-MWNT), or related MWNTs, exhibit a good quality compared to the more common type of MWNT synthesized by catalytic chemical vapor deposition methods. Yet experimental measurements on these are rather few and typically have not correlated data from different measurement techniques. Here, the authors report Raman spectroscopy, scanning probe microscopy, conductivity measurements, and force microscopy on single AD-MWNTs. The results demonstrate the high quality of AD-MWNTs and are compatible with the view of them as the best approximation of MWNTs as an assembly of defect-free concentric individual single-walled carbon nanotubes. The authors also demonstrate conductance measurements over a step on the surface of an AD-MWNT, which is due to an abruptly broken outer layer(s), whereby the interlayer resistance is measured.en
dc.format.mimetypeapplication/pdf
dc.languageeng
dc.language.isoeng
dc.publisherAmerican Institute of Physics
dc.relation.ispartofseriesJournal of Vacuum Science and Technology. Part B. Nanotechnology and Microelectronics
dc.rightsIn Copyright
dc.subject.otherelectronic devices
dc.subject.otherscanning tunneling microscopy
dc.subject.otherscanning probe microscopy
dc.subject.otherscanning electron microscopy
dc.subject.otherelectric discharges
dc.subject.otheratomic force microscopy
dc.subject.otherraman spectroscopy
dc.subject.othernanotubes
dc.titleIndividual arc-discharge synthesized multiwalled carbon nanotubes probed with multiple measurement techniques
dc.typearticle
dc.identifier.urnURN:NBN:fi:jyu-202007035231
dc.contributor.laitosFysiikan laitosfi
dc.contributor.laitosDepartment of Physicsen
dc.type.urihttp://purl.org/eprint/type/JournalArticle
dc.type.coarhttp://purl.org/coar/resource_type/c_2df8fbb1
dc.description.reviewstatuspeerReviewed
dc.relation.issn2166-2746
dc.relation.numberinseries4
dc.relation.volume38
dc.type.versionpublishedVersion
dc.rights.copyright© 2020 Author(s).
dc.rights.accesslevelopenAccessfi
dc.subject.ysoatomivoimamikroskopia
dc.subject.ysonanoputket
dc.subject.ysoatomifysiikka
dc.format.contentfulltext
jyx.subject.urihttp://www.yso.fi/onto/yso/p38648
jyx.subject.urihttp://www.yso.fi/onto/yso/p25661
jyx.subject.urihttp://www.yso.fi/onto/yso/p16034
dc.rights.urlhttp://rightsstatements.org/page/InC/1.0/?language=en
dc.relation.doi10.1116/6.0000187
jyx.fundinginformationM.A. acknowledges the Academy of Finland for financial support. D.L. acknowledges financial support from the Russian Foundation for Basic Research (Grant No. 18-29-19043 mk).
dc.type.okmA1


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