Direct Ionization Impact on Accelerator Mixed-Field Soft Error Rate
Alía, R. G., Tali, M., Brugger, M., Cecchetto, M., Cerutti, F., Cononetti, A., Danzeca, S., Esposito, L., Fernández-Martínez, P., Gilardoni, S., Infantino, A., Kastriotou, M., Kerboub, N., Lerner, G., Wyrwoll, V., Ferlet-Cavrois, V., Boatella, C., Javanainen, A., Kettunen, H., . . . Puchner, H. (2020). Direct Ionization Impact on Accelerator Mixed-Field Soft Error Rate. IEEE Transactions on Nuclear Science, 67(1), 345-352. https://doi.org/10.1109/TNS.2019.2951307
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IEEE Transactions on Nuclear ScienceDate
2020Copyright
© 2020 The Authors
We investigate, through measurements and simulations, the possible direct ionization impact in the accelerator soft error rate, not considered in standard qualification approaches. Results show that, for a broad variety of state-of-the art commercial components considered in the 65 nm to 16 nm technological range, indirect ionization is still expected to dominate the overall soft-error rate in the accelerator mixed-field. However, the derived critical charges of the most sensitive parts, corresponding to ∼0.7 fC, are expected to be at the limit of rapid direct ionization dominance and soft-error increase.
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Institute of Electrical and Electronics EngineersISSN Search the Publication Forum
0018-9499Publication in research information system
https://converis.jyu.fi/converis/portal/detail/Publication/33480405
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The content of the publication reflects only the author’s view. The funder is not responsible for any use that may be made of the information it contains.
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RADSAGA has received funding from the European Union’s Horizon 2020 Research and Innovation Programme under the Grant Agreement no. 721624. Moreover, part of this work done at the University of Jyvaskyla was supported by the European Space Agency (ESA/ESTEC Contract 4000124504/18/NL/KML/zk).License
Except where otherwise noted, this item's license is described as CC BY 4.0