Direct Ionization Impact on Accelerator Mixed-Field Soft Error Rate
Alía, R. G., Tali, M., Brugger, M., Cecchetto, M., Cerutti, F., Cononetti, A., Danzeca, S., Esposito, L., Fernández-Martínez, P., Gilardoni, S., Infantino, A., Kastriotou, M., Kerboub, N., Lerner, G., Wyrwoll, V., Ferlet-Cavrois, V., Boatella, C., Javanainen, A., Kettunen, H., . . . Puchner, H. (2020). Direct Ionization Impact on Accelerator Mixed-Field Soft Error Rate. IEEE Transactions on Nuclear Science, 67(1), 345-352. https://doi.org/10.1109/TNS.2019.2951307
Published inIEEE Transactions on Nuclear Science
Tali, M. |
© 2020 The Authors
We investigate, through measurements and simulations, the possible direct ionization impact in the accelerator soft error rate, not considered in standard qualification approaches. Results show that, for a broad variety of state-of-the art commercial components considered in the 65 nm to 16 nm technological range, indirect ionization is still expected to dominate the overall soft-error rate in the accelerator mixed-field. However, the derived critical charges of the most sensitive parts, corresponding to ∼0.7 fC, are expected to be at the limit of rapid direct ionization dominance and soft-error increase.
PublisherInstitute of Electrical and Electronics Engineers
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Related funder(s)European Commission
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