Direct Ionization Impact on Accelerator Mixed-Field Soft Error Rate
Alía, R. G., Tali, M., Brugger, M., Cecchetto, M., Cerutti, F., Cononetti, A., Danzeca, S., Esposito, L., Fernández-Martínez, P., Gilardoni, S., Infantino, A., Kastriotou, M., Kerboub, N., Lerner, G., Wyrwoll, V., Ferlet-Cavrois, V., Boatella, C., Javanainen, A., Kettunen, H., . . . Puchner, H. (2020). Direct Ionization Impact on Accelerator Mixed-Field Soft Error Rate. IEEE Transactions on Nuclear Science, 67(1), 345-352. https://doi.org/10.1109/TNS.2019.2951307
Published inIEEE Transactions on Nuclear Science
Tali, M. |
© 2020 The Authors
We investigate, through measurements and simulations, the possible direct ionization impact in the accelerator soft error rate, not considered in standard qualification approaches. Results show that, for a broad variety of state-of-the art commercial components considered in the 65 nm to 16 nm technological range, indirect ionization is still expected to dominate the overall soft-error rate in the accelerator mixed-field. However, the derived critical charges of the most sensitive parts, corresponding to ∼0.7 fC, are expected to be at the limit of rapid direct ionization dominance and soft-error increase.
PublisherInstitute of Electrical and Electronics Engineers
Publication in research information system
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Related funder(s)European Commission
The content of the publication reflects only the author’s view. The funder is not responsible for any use that may be made of the information it contains.
Additional information about fundingRADSAGA has received funding from the European Union’s Horizon 2020 Research and Innovation Programme under the Grant Agreement no. 721624. Moreover, part of this work done at the University of Jyvaskyla was supported by the European Space Agency (ESA/ESTEC Contract 4000124504/18/NL/KML/zk).
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