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dc.contributor.authorTimonen, Oskari
dc.contributor.authorKoivisto, Hannu
dc.contributor.authorKronholm, Risto
dc.contributor.authorToivanen, Ville
dc.date.accessioned2024-05-23T12:05:25Z
dc.date.available2024-05-23T12:05:25Z
dc.date.issued2024
dc.identifier.citationTimonen, O., Koivisto, H., Kronholm, R., & Toivanen, V. (2024). Time-resolved measurement of optical emission line profiles from electron cyclotron resonance ion source plasma. In <i>20th International Conference on Ion Sources</i> (Article 012008). IOP Publishing. Journal of Physics : Conference Series, 2743. <a href="https://doi.org/10.1088/1742-6596/2743/1/012008" target="_blank">https://doi.org/10.1088/1742-6596/2743/1/012008</a>
dc.identifier.otherCONVID_215860529
dc.identifier.urihttps://jyx.jyu.fi/handle/123456789/95129
dc.description.abstractOptical emission spectroscopy provides a non-invasive method to probe the properties of hot and highly charged magnetically confined plasmas. The optical emission line profiles enable, for example, to identify the different species and characterize the relative population densities and temperatures of the ions and neutrals forming the plasma. The feasibility of this approach has been demonstrated at the University of Jyväskylä accelerator laboratory by measuring the light emitted by Electron Cyclotron Resonance Ion Source (ECRIS) plasma with a high-resolution spectrometer setup POSSU (Plasma Optical SpectroScopy Unit). In these previous studies, the emission line profiles were measured by scanning the desired wavelength range by rotating the diffraction grating of the spectrometer. This process is slow compared to many interesting plasma phenomena, thus limiting the applicability of the setup. Recently, POSSU has been upgraded by changing the light sensor from a photomultiplier tube to a position-sensitive imaging sensor. As a result, it is possible to measure simultaneously a 1 - 2 nm wavelength range, with a spectral resolution in the order of picometers, without moving the grating. This enables a time-resolved study of the optical emission line profiles. By turning the grating, the measured wavelength region can be chosen between 370 nm and 870 nm, which covers the visible light spectrum. The time-evolution of optical emission line profiles emitted from the JYFL 14 GHz ECRIS plasma, during shifting plasma conditions induced by changing the gas balance, has been measured to demonstrate this new capability. The time-evolution of temperatures and emission intensities of selected ion species, correlated with extracted ion beam currents, are presented.en
dc.format.mimetypeapplication/pdf
dc.language.isoeng
dc.publisherIOP Publishing
dc.relation.ispartof20th International Conference on Ion Sources
dc.relation.ispartofseriesJournal of Physics : Conference Series
dc.rightsCC BY 3.0
dc.titleTime-resolved measurement of optical emission line profiles from electron cyclotron resonance ion source plasma
dc.typeconferenceObject
dc.identifier.urnURN:NBN:fi:jyu-202405233893
dc.contributor.laitosFysiikan laitosfi
dc.contributor.laitosDepartment of Physicsen
dc.type.urihttp://purl.org/eprint/type/ConferencePaper
dc.type.coarhttp://purl.org/coar/resource_type/c_5794
dc.description.reviewstatuspeerReviewed
dc.relation.issn1742-6588
dc.type.versionpublishedVersion
dc.rights.copyright© 2024 the Authors
dc.rights.accesslevelopenAccessfi
dc.relation.conferenceInternational Conference on Ion Sources
dc.relation.grantnumber101057511
dc.relation.grantnumber315855
dc.subject.ysosyklotronit
dc.subject.ysoplasmafysiikka
dc.format.contentfulltext
jyx.subject.urihttp://www.yso.fi/onto/yso/p15295
jyx.subject.urihttp://www.yso.fi/onto/yso/p10238
dc.rights.urlhttps://creativecommons.org/licenses/by/3.0/
dc.relation.doi10.1088/1742-6596/2743/1/012008
dc.relation.funderEuropean Commissionen
dc.relation.funderResearch Council of Finlanden
dc.relation.funderEuroopan komissiofi
dc.relation.funderSuomen Akatemiafi
jyx.fundingprogramResearch infrastructures, HEen
jyx.fundingprogramAcademy Project, AoFen
jyx.fundingprogramResearch infrastructures, HEfi
jyx.fundingprogramAkatemiahanke, SAfi
jyx.fundinginformationThis work has been supported by the Academy of Finland Project funding (N:o 315855), and has received funding from the European Union’s Horizon Europe Research and Innovation programme under Grant Agreement No 101057511.
dc.type.okmA4


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