Show simple item record

dc.contributor.authorMarttinen, M.
dc.contributor.authorAngot, J.
dc.contributor.authorAnnaluru, A.
dc.contributor.authorJardin, P.
dc.contributor.authorKalvas, T.
dc.contributor.authorKoivisto, H.
dc.contributor.authorKosonen, S.
dc.contributor.authorKronholm, R.
dc.contributor.authorMaunoury, L.
dc.contributor.authorTarvainen, O.
dc.contributor.authorToivanen, V.
dc.contributor.authorUjic, P.
dc.date.accessioned2020-01-22T08:30:33Z
dc.date.available2020-01-22T08:30:33Z
dc.date.issued2020
dc.identifier.citationMarttinen, M., Angot, J., Annaluru, A., Jardin, P., Kalvas, T., Koivisto, H., Kosonen, S., Kronholm, R., Maunoury, L., Tarvainen, O., Toivanen, V., & Ujic, P. (2020). Estimating ion confinement times from beam current transients in conventional and charge breeder ECRIS. <i>Review of Scientific Instruments</i>, <i>91</i>(1), Article 013304. <a href="https://doi.org/10.1063/1.5128546" target="_blank">https://doi.org/10.1063/1.5128546</a>
dc.identifier.otherCONVID_34172688
dc.identifier.urihttps://jyx.jyu.fi/handle/123456789/67461
dc.description.abstractCumulative ion confinement times are probed by measuring decaying ion current transients in pulsed material injection mode. The method is applied in a charge breeder and conventional ECRIS yielding mutually corroborative results. The cumulative confinement time estimates vary from approximately 2 ms–60 ms with a clear dependence on the ion charge-to-mass ratio—higher charges having longer residence times. The long cumulative confinement times are proposed as a partial explanation to recently observed unexpectedly high ion temperatures. The results are relevant for rare ion beam (RIB) production as the confinement time and the lifetime of stable isotopes can be used for estimating the extracted RIB production efficiency.en
dc.format.mimetypeapplication/pdf
dc.languageeng
dc.language.isoeng
dc.publisherAmerican Institute of Physics
dc.relation.ispartofseriesReview of Scientific Instruments
dc.rightsIn Copyright
dc.subject.otherplasma sources
dc.subject.otherplasma diagnostics
dc.subject.otherion sources
dc.subject.otherplasma discharges
dc.titleEstimating ion confinement times from beam current transients in conventional and charge breeder ECRIS
dc.typearticle
dc.identifier.urnURN:NBN:fi:jyu-202001221406
dc.contributor.laitosFysiikan laitosfi
dc.contributor.laitosDepartment of Physicsen
dc.contributor.oppiaineKiihdytinlaboratoriofi
dc.contributor.oppiaineAccelerator Laboratoryen
dc.type.urihttp://purl.org/eprint/type/JournalArticle
dc.description.reviewstatuspeerReviewed
dc.relation.issn0034-6748
dc.relation.numberinseries1
dc.relation.volume91
dc.type.versionpublishedVersion
dc.rights.copyright© 2020 AIP Publishing
dc.rights.accesslevelopenAccessfi
dc.relation.grantnumber315855
dc.relation.grantnumber654002
dc.relation.grantnumber654002
dc.relation.projectidinfo:eu-repo/grantAgreement/EC/H2020/654002/EU//
dc.subject.ysoplasmatekniikka
dc.format.contentfulltext
jyx.subject.urihttp://www.yso.fi/onto/yso/p8568
dc.rights.urlhttp://rightsstatements.org/page/InC/1.0/?language=en
dc.relation.doi10.1063/1.5128546
dc.relation.funderSuomen Akatemiafi
dc.relation.funderEuroopan komissiofi
dc.relation.funderAcademy of Finlanden
dc.relation.funderEuropean Commissionen
jyx.fundingprogramAkatemiahanke, SAfi
jyx.fundingprogramResearch infrastructures, H2020fi
jyx.fundingprogramAcademy Project, AoFen
jyx.fundingprogramResearch infrastructures, H2020en
jyx.fundinginformationThe project has received funding from the Academy of Finland under the Finnish Centre of Excellence Programme 2012-2017 (Nuclear and Accelerator Based Physics Research at JYFL, Project No. 213503) and the Academy of Finland Project funding (No. 315855), as well as from the European Union’s Horizon 2020 research and innovation programme under Grant Agreement No. 654002. This work has been supported also by Jenny and Antti Wihuri foundation.


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record

In Copyright
Except where otherwise noted, this item's license is described as In Copyright