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dc.contributor.authorKronholm, R.
dc.contributor.authorKalvas, T.
dc.contributor.authorKoivisto, H.
dc.contributor.authorKosonen, S.
dc.contributor.authorMarttinen, M.
dc.contributor.authorNeben, D.
dc.contributor.authorSakildien, M.
dc.contributor.authorTarvainen, O.
dc.contributor.authorToivanen, V.
dc.date.accessioned2020-01-21T12:53:39Z
dc.date.available2020-01-21T12:53:39Z
dc.date.issued2020
dc.identifier.citationKronholm, R., Kalvas, T., Koivisto, H., Kosonen, S., Marttinen, M., Neben, D., Sakildien, M., Tarvainen, O., & Toivanen, V. (2020). ECRIS plasma spectroscopy with a high resolution spectrometer. <i>Review of Scientific Instruments</i>, <i>91</i>(1), Article 013318. <a href="https://doi.org/10.1063/1.5128854" target="_blank">https://doi.org/10.1063/1.5128854</a>
dc.identifier.otherCONVID_34187675
dc.identifier.urihttps://jyx.jyu.fi/handle/123456789/67430
dc.description.abstractElectron Cyclotron Resonance Ion Source (ECRIS) plasmas contain high-energy electrons and highly charged ions implying that only noninvasive methods such as optical emission spectroscopy are reliable in their characterization. A high-resolution spectrometer (10 pm FWHM at 632 nm) enabling the detection of weak emission lines has been developed at University of Jyväskylä, Department of Physics (JYFL) for this purpose. Diagnostics results probing the densities of ions, neutral atoms, and the temperature of the cold electron population in the JYFL 14 GHz ECRIS are described. For example, it has been observed that the cold electron temperature drops from 40 eV to 20 eV when the extraction voltage of the ion source is switched off, accompanied by two orders of magnitude decrease in Ar9+ optical emission intensity, suggesting that diagnostics results of ECRIS plasmas obtained without the extraction voltage are not depicting the plasma conditions of normal ECRIS operation. The relative changes of the plasma optical emission and the ion beam current have been measured in CW and amplitude modulation operation mode of microwave injection. It is concluded that in the CW mode, the ion currents could be limited by diffusion transport and electrostatic confinement of the ions rather than beam formation in the extraction region and subsequent transport. The high resolution of the spectrometer allows determining the ion temperature by measuring the Doppler broadening of the emission lines and subtracting the wavelength dependent instrumental broadening. The measured ion temperatures in the JYFL 14 GHz ECRIS are between 5 and 28 eV, depending on the plasma species and charge state. Gas mixing is shown to be an effective method to decrease the ion temperature of high charge state argon ions from 20 eV in pure argon discharge to 5 eV when mixed with oxygen. I. INTRen
dc.format.mimetypeapplication/pdf
dc.languageeng
dc.language.isoeng
dc.publisherAmerican Institute of Physics
dc.relation.ispartofseriesReview of Scientific Instruments
dc.rightsIn Copyright
dc.subject.otheremission spectroscopy
dc.subject.otherelectron impact ionization
dc.subject.otherplasma spectroscopy
dc.subject.otherphotomultipliers
dc.subject.otherdoppler effect
dc.subject.othermonochromators
dc.subject.otherplasma confinement
dc.subject.otherion sources
dc.subject.otheramplitude modulation
dc.titleECRIS plasma spectroscopy with a high resolution spectrometer
dc.typearticle
dc.identifier.urnURN:NBN:fi:jyu-202001211383
dc.contributor.laitosFysiikan laitosfi
dc.contributor.laitosDepartment of Physicsen
dc.contributor.oppiaineKiihdytinlaboratoriofi
dc.contributor.oppiaineAccelerator Laboratoryen
dc.type.urihttp://purl.org/eprint/type/JournalArticle
dc.type.coarhttp://purl.org/coar/resource_type/c_2df8fbb1
dc.description.reviewstatuspeerReviewed
dc.relation.issn0034-6748
dc.relation.numberinseries1
dc.relation.volume91
dc.type.versionpublishedVersion
dc.rights.copyright© 2020 Author(s)
dc.rights.accesslevelopenAccessfi
dc.relation.grantnumber315855
dc.relation.grantnumber654002
dc.relation.grantnumber654002
dc.relation.projectidinfo:eu-repo/grantAgreement/EC/H2020/654002/EU//
dc.subject.ysospektroskopia
dc.format.contentfulltext
jyx.subject.urihttp://www.yso.fi/onto/yso/p10176
dc.rights.urlhttp://rightsstatements.org/page/InC/1.0/?language=en
dc.relation.doi10.1063/1.5128854
dc.relation.funderResearch Council of Finlanden
dc.relation.funderEuropean Commissionen
dc.relation.funderSuomen Akatemiafi
dc.relation.funderEuroopan komissiofi
jyx.fundingprogramAcademy Project, AoFen
jyx.fundingprogramResearch infrastructures, H2020en
jyx.fundingprogramAkatemiahanke, SAfi
jyx.fundingprogramResearch infrastructures, H2020fi
jyx.fundinginformationThe JYFL high resolution spectroscopy project has received funding from the European Union’s Horizon 2020 research and innovation programme under Grant Agreement No. 654002 and the Academy of Finland under the Finnish Centre of Excellence Programme 2012–2017 (Nuclear and Accelerator Based Physics Research at JYFL, Project No. 213503) and the Academy of Finland Project funding (No. 315855).
dc.type.okmA1


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