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dc.contributor.authorSchuh, M.
dc.contributor.authorHeiße, F.
dc.contributor.authorEronen, T.
dc.contributor.authorKetter, J.
dc.contributor.authorKöhler-Langes, F.
dc.contributor.authorRau, S.
dc.contributor.authorSegal, T.
dc.contributor.authorQuint, W.
dc.contributor.authorSturm, S.
dc.contributor.authorBlaum, K.
dc.date.accessioned2019-08-28T07:22:41Z
dc.date.available2019-08-28T07:22:41Z
dc.date.issued2019
dc.identifier.citationSchuh, M., Heiße, F., Eronen, T., Ketter, J., Köhler-Langes, F., Rau, S., Segal, T., Quint, W., Sturm, S., & Blaum, K. (2019). Image charge shift in high-precision Penning traps. <i>Physical Review A</i>, <i>100</i>(2), Article 23411. <a href="https://doi.org/10.1103/PhysRevA.100.023411" target="_blank">https://doi.org/10.1103/PhysRevA.100.023411</a>
dc.identifier.otherCONVID_32391346
dc.identifier.urihttps://jyx.jyu.fi/handle/123456789/65345
dc.description.abstractAn ion in a Penning trap induces image charges on the surfaces of the trap electrodes. These induced image charges are used to detect the ion's motional frequencies, but they also create an additional electric field, which shifts the free-space cyclotron frequency typically at a relative level of several 10 −11. In various high-precision Penning-trap experiments, systematics and their uncertainties are dominated by this so-called image charge shift (ICS). The ICS is investigated in this work by a finite-element simulation and by a dedicated measurement technique. Theoretical and experimental results are in excellent agreement. The measurement is using singly stored ions alternately measured in the same Penning trap. For the determination of the ion's magnetron frequency with relative precision of better than 10 parts per billion, a Ramsey-like technique has been developed. In addition, numerical calculations are carried out for other Penning traps and agree with older ICS measurements.en
dc.format.mimetypeapplication/pdf
dc.languageeng
dc.language.isoeng
dc.publisherAmerican Physical Society
dc.relation.ispartofseriesPhysical Review A
dc.rightsIn Copyright
dc.subject.otherPenning traps
dc.titleImage charge shift in high-precision Penning traps
dc.typearticle
dc.identifier.urnURN:NBN:fi:jyu-201908283950
dc.contributor.laitosFysiikan laitosfi
dc.contributor.laitosDepartment of Physicsen
dc.type.urihttp://purl.org/eprint/type/JournalArticle
dc.description.reviewstatuspeerReviewed
dc.relation.issn2469-9926
dc.relation.numberinseries2
dc.relation.volume100
dc.type.versionpublishedVersion
dc.rights.copyright© 2019 American Physical Society
dc.rights.accesslevelopenAccessfi
dc.relation.grantnumber295207
dc.subject.ysoionit
dc.subject.ysotutkimuslaitteet
dc.format.contentfulltext
jyx.subject.urihttp://www.yso.fi/onto/yso/p9015
jyx.subject.urihttp://www.yso.fi/onto/yso/p2440
dc.rights.urlhttp://rightsstatements.org/page/InC/1.0/?language=en
dc.relation.doi10.1103/PhysRevA.100.023411
dc.relation.funderSuomen Akatemiafi
dc.relation.funderAcademy of Finlanden
jyx.fundingprogramAkatemiatutkijan tehtävä, SAfi
jyx.fundingprogramResearch post as Academy Research Fellow, AoFen
jyx.fundinginformationThis work was funded by the Max-Planck-Gesellschaft. J.K., S.R., and T.S. acknowledge support by the International Max Planck Research School for Precision Tests of Fundamental Symmetries (IMPRS-PTFS). F.H. acknowledges support by the International Max Planck Research School of Quantum Dynamics (IMPRS-QD). Support by the SFB 1225 (ISOQUANT) is acknowledged. T.E. acknowledges support from Academy of Finland under Project No. 295207. We thank Jiamin Hou, David B. Pinegar, Martin Höcker, Sebastian Streubel, and Christoph Diehl for earlier contributions. We thank J.V. (Trey) Porto for sharing his matlab code [32] with Christoph Diehl in 2008.


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