Characterization of a pulsed injection-locked Ti:sapphire laser and its application to high resolution resonance ionization spectroscopy of copper
Sonnenschein, V., Moore, I., Raeder, S., Reponen, M., Tomita, H., & Wendt, K. (2017). Characterization of a pulsed injection-locked Ti:sapphire laser and its application to high resolution resonance ionization spectroscopy of copper. Laser Physics, 27 (8), 085701. doi:10.1088/1555-6611/aa7834
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Laser PhysicsDate
2017Copyright
© 2018 IOP Publishing
A high repetition rate pulsed Ti:sapphire laser injection-locked to a
continuous wave seed source is presented. A spectral linewidth of 20 MHz at an average
output power of 4W is demonstrated. An enhanced tuning range from 710-920 nm with
a single broadband mirror set is realized by the inclusion of a single thin birefringent
quartz plate for suppression of unseeded emission. The spectral properties have been
analyzed using both a scanning Fabry-P´erot interferometer as well as crossed beam
resonance ionization spectroscopy of the hyperfine levels of natural copper. Delayed
ionization of the long-lived excited state is demonstrated for increased resolution. For
the excited state hyperfine coupling constant of the 244 nm 4s 2S1/2 → 4s4p4P
◦
1/2
ground-state transition in 63Cu, a factor of ten reduction in error compared to previous
literature was achieved. The described laser system has been in operation at several
radioactive ion beam facilities.
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Institute of Physics Publishing Ltd.ISSN Search the Publication Forum
1054-660XMetadata
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