Characterization of a pulsed injection-locked Ti:sapphire laser and its application to high resolution resonance ionization spectroscopy of copper
Sonnenschein, V., Moore, I., Raeder, S., Reponen, M., Tomita, H., & Wendt, K. (2017). Characterization of a pulsed injection-locked Ti:sapphire laser and its application to high resolution resonance ionization spectroscopy of copper. Laser Physics, 27 (8), 085701. doi:10.1088/1555-6611/aa7834
Published inLaser Physics
© 2018 IOP Publishing
A high repetition rate pulsed Ti:sapphire laser injection-locked to a continuous wave seed source is presented. A spectral linewidth of 20 MHz at an average output power of 4W is demonstrated. An enhanced tuning range from 710-920 nm with a single broadband mirror set is realized by the inclusion of a single thin birefringent quartz plate for suppression of unseeded emission. The spectral properties have been analyzed using both a scanning Fabry-P´erot interferometer as well as crossed beam resonance ionization spectroscopy of the hyperfine levels of natural copper. Delayed ionization of the long-lived excited state is demonstrated for increased resolution. For the excited state hyperfine coupling constant of the 244 nm 4s 2S1/2 → 4s4p4P ◦ 1/2 ground-state transition in 63Cu, a factor of ten reduction in error compared to previous literature was achieved. The described laser system has been in operation at several radioactive ion beam facilities.
PublisherInstitute of Physics Publishing Ltd.
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Sonnenschein, Volker (University of Jyväskylä, 2014)
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