Show simple item record

dc.contributor.authorJulin, Juhani
dc.date.accessioned2016-10-03T12:20:20Z
dc.date.available2016-10-03T12:20:20Z
dc.date.issued2016
dc.identifier.isbn978-951-39-6679-9
dc.identifier.otheroai:jykdok.linneanet.fi:1574833
dc.identifier.urihttps://jyx.jyu.fi/handle/123456789/51503
dc.format.extentVerkkoaineisto (x, 92 sivua)
dc.language.isoeng
dc.publisherUniversity of Jyväskylä
dc.relation.ispartofseriesResearch report / Department of Physics, University of Jyväskylä
dc.relation.haspart<b>Artikkeli I:</b> Julin, J., Koppinen, P., & Maasilta, I. (2010). Reduction of low-frequency 1/f noise in Al-AlOx-Al tunnel junctions by thermal annealing. <i>Applied Physics Letters, 97, 152501.</i> DOI: <a href="https://doi.org/10.1063/1.3500823"target="_blank"> 10.1063/1.3500823</a>
dc.relation.haspart<b>Artikkeli II:</b> Julin, J., Chaudhuri, S., Laitinen, M., Sajavaara, T., & Maasilta, I. (2016). Stability, sub-gap current, 1/f-noise, and elemental depth profiling of annealed Al:Mn-AlOX-Al normal metal-insulator-superconducting tunnel junctions. <i>AIP Advances, 6(12), Article 125026.</i> DOI: <a href="https://doi.org/10.1063/1.4972205"target="_blank"> 10.1063/1.4972205</a>
dc.relation.haspart<b>Artikkeli III:</b> Julin, J., & Maasilta, I. (2016). Applications and non-idealities of submicron Al–AlOx–Nb tunnel junctions. <i>Superconductor Science and Technology, 29(10), Article 105003.</i> DOI: <a href="https://doi.org/10.1088/0953-2048/29/10/105003"target="_blank"> 10.1088/0953-2048/29/10/105003</a>. JYX: <a href="https://jyx.jyu.fi/handle/123456789/51663"target="_blank"> jyx.jyu.fi/handle/123456789/51663</a>
dc.relation.haspart<b>Artikkeli IV:</b> Govenius, J., Lake, R. E., Tan, K. Y., Pietilä, V., Julin, J., Maasilta, I., Virtanen, P., & Möttönen, M. (2014). Microwave nanobolometer based on proximity Josephson junctions. <i>Physical review B, 90(6), Article 064505.</i> DOI: <a href="https://doi.org/10.1103/PhysRevB.90.064505"target="_blank">10.1103/PhysRevB.90.064505</a>. <a href="http://arxiv.org/abs/1403.6586"target="_blank"> Arxiv</a>
dc.subject.otherlow temperature physics
dc.subject.othernanofabrication
dc.subject.othertunnel junctions
dc.subject.otherJosephson junctions
dc.subject.otherNIS/SIS tunneling
dc.subject.othersupercurrent
dc.subject.othersuperconductor
dc.subject.othercryogenics
dc.subject.othernoise
dc.subject.other1/f noise
dc.subject.otherannealing
dc.subject.othernegative absolute resistance
dc.subject.otherniobium-based superconducting devices
dc.titleFabrication, electrical characterization and 1/f noise study of submicron-sized superconducting tunnel junctions
dc.typeDiss.
dc.identifier.urnURN:ISBN:978-951-39-6679-9
dc.type.dcmitypeTexten
dc.type.ontasotVäitöskirjafi
dc.type.ontasotDoctoral dissertationen
dc.contributor.tiedekuntaMatemaattis-luonnontieteellinen tiedekuntafi
dc.contributor.tiedekuntaFaculty of Mathematics and Scienceen
dc.contributor.yliopistoUniversity of Jyväskyläen
dc.contributor.yliopistoJyväskylän yliopistofi
dc.contributor.oppiaineFysiikkafi
dc.relation.issn0075-465X
dc.relation.numberinseries2016, 8
dc.rights.accesslevelopenAccessfi
dc.subject.ysokylmäfysiikka
dc.subject.ysonanorakenteet
dc.subject.ysosuprajohteet
dc.subject.ysoalumiini
dc.subject.ysomangaani
dc.subject.ysoniobium
dc.subject.ysosähkönjohtavuus
dc.subject.ysosuprajohtavuus
dc.subject.ysolämpökäsittely
dc.subject.ysokohina


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record