Fabrication, electrical characterization and 1/f noise study of submicron-sized superconducting tunnel junctions
Publisher
University of JyväskyläISBN
978-951-39-6679-9ISSN Search the Publication Forum
0075-465XContains publications
- Artikkeli I: Julin, J., Koppinen, P., & Maasilta, I. (2010). Reduction of low-frequency 1/f noise in Al-AlOx-Al tunnel junctions by thermal annealing. Applied Physics Letters, 97, 152501. DOI: 10.1063/1.3500823
- Artikkeli II: Julin, J., Chaudhuri, S., Laitinen, M., Sajavaara, T., & Maasilta, I. (2016). Stability, sub-gap current, 1/f-noise, and elemental depth profiling of annealed Al:Mn-AlOX-Al normal metal-insulator-superconducting tunnel junctions. AIP Advances, 6(12), Article 125026. DOI: 10.1063/1.4972205
- Artikkeli III: Julin, J., & Maasilta, I. (2016). Applications and non-idealities of submicron Al–AlOx–Nb tunnel junctions. Superconductor Science and Technology, 29(10), Article 105003. DOI: 10.1088/0953-2048/29/10/105003. JYX: jyx.jyu.fi/handle/123456789/51663
- Artikkeli IV: Govenius, J., Lake, R. E., Tan, K. Y., Pietilä, V., Julin, J., Maasilta, I., Virtanen, P., & Möttönen, M. (2014). Microwave nanobolometer based on proximity Josephson junctions. Physical review B, 90(6), Article 064505. DOI: 10.1103/PhysRevB.90.064505. Arxiv
Keywords
low temperature physics nanofabrication tunnel junctions Josephson junctions NIS/SIS tunneling supercurrent superconductor cryogenics noise 1/f noise annealing negative absolute resistance niobium-based superconducting devices kylmäfysiikka nanorakenteet suprajohteet alumiini mangaani niobium sähkönjohtavuus suprajohtavuus lämpökäsittely kohina
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