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dc.contributor.authorMatanaluza, Lucas
dc.contributor.authorRuospo, Annachiara
dc.contributor.authorSöderström, Daniel
dc.contributor.authorCazzaniga, Carlo
dc.contributor.authorKastriotou, Maria
dc.contributor.authorSanchez, Ernesto
dc.contributor.authorBosio, Alberto
dc.contributor.authorDilillo, Luigi
dc.date.accessioned2023-02-02T12:52:56Z
dc.date.available2023-02-02T12:52:56Z
dc.date.issued2022
dc.identifier.citationMatanaluza, L., Ruospo, A., Söderström, D., Cazzaniga, C., Kastriotou, M., Sanchez, E., Bosio, A., & Dilillo, L. (2022). Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks. <i>IEEE Transactions on Emerging Topics in Computing</i>, <i>10</i>(4), 1867-1882. <a href="https://doi.org/10.1109/TETC.2021.3116999" target="_blank">https://doi.org/10.1109/TETC.2021.3116999</a>
dc.identifier.otherCONVID_101536988
dc.identifier.urihttps://jyx.jyu.fi/handle/123456789/85322
dc.description.abstractConvolutional Neural Networks (CNNs) are currently one of the most widely used predictive models in machine learning. Recent studies have demonstrated that hardware faults induced by radiation fields, including cosmic rays, may significantly impact the CNN inference leading to wrong predictions. Therefore, ensuring the reliability of CNNs is crucial, especially for safety-critical systems. In the literature, several works propose reliability assessments of CNNs mainly based on statistically injected faults. This work presents a software emulator capable of injecting real faults retrieved from radiation tests. Specifically, from the device characterisation of a DRAM memory, we extracted event rates and fault models. The software emulator can reproduce their incidence and access their effect on CNN applications with a reliability assessment precision close to the physical one. Radiation-based physical injections and emulator-based injections are performed on three CNNs (LeNet-5) exploiting different data representations. Their outcomes are compared, and the software results evidence that the emulator is able to reproduce the faulty behaviours observed during the radiation tests for the targeted CNNs. This approach leads to a more concise use of radiation experiments since the extracted fault models can be reused to explore different scenarios (e.g., impact on a different application).en
dc.format.mimetypeapplication/pdf
dc.language.isoeng
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartofseriesIEEE Transactions on Emerging Topics in Computing
dc.rightsIn Copyright
dc.subject.otherneural nets
dc.subject.otherreliability
dc.subject.otherapproximate methods
dc.subject.otherfault injection
dc.subject.otherradiation effects
dc.titleEmulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks
dc.typearticle
dc.identifier.urnURN:NBN:fi:jyu-202302021604
dc.contributor.laitosFysiikan laitosfi
dc.contributor.laitosDepartment of Physicsen
dc.type.urihttp://purl.org/eprint/type/JournalArticle
dc.type.coarhttp://purl.org/coar/resource_type/c_2df8fbb1
dc.description.reviewstatuspeerReviewed
dc.format.pagerange1867-1882
dc.relation.issn2376-4562
dc.relation.numberinseries4
dc.relation.volume10
dc.type.versionacceptedVersion
dc.rights.copyright© Authors
dc.rights.accesslevelopenAccessfi
dc.relation.grantnumber721624
dc.relation.grantnumber721624
dc.relation.projectidinfo:eu-repo/grantAgreement/EC/H2020/721624/EU//RADSAGA
dc.format.contentfulltext
dc.rights.urlhttp://rightsstatements.org/page/InC/1.0/?language=en
dc.relation.doi10.1109/TETC.2021.3116999
dc.relation.funderEuropean Commissionen
dc.relation.funderEuroopan komissiofi
jyx.fundingprogramMSCA Innovative Training Networks (ITN)en
jyx.fundingprogramMSCA Innovative Training Networks (ITN)fi
jyx.fundinginformationVAN ALLEN Foundation (Grant Number: Contract No. UM 181387); European Unions Horizon 2020 research innovation programme (Grant Number: Marie Skodowska-Curie grant agreement No 721624); Region Occitanie (Grant Number: Contract No. UM 181386); IDEX Lyon OdeLe
dc.type.okmA1


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