H- beam emittance analysis in a multicusp ion source
Abstract
Emittance of the ion beam extracted from an ion source is dependent on the initial focusing action at the plasma sheath. The properties of the plasma sheath is further dependent on the local electric fields and charge densities around the sheath. Experiments are conducted for creating different sets of conditions around the plasma sheath in an H- multicusp filament ion source and the resulting emittance of the extracted H- ion beam is measured. Variation of beam emittance under different plasma densities, electrode voltages and gas flows are analysed.
Main Authors
Format
Conferences
Conference paper
Published
2022
Series
Subjects
Publication in research information system
Publisher
IOP Publishing
The permanent address of the publication
https://urn.fi/URN:NBN:fi:jyu-202208124055Use this for linking
Review status
Peer reviewed
ISSN
1742-6588
DOI
https://doi.org/10.1088/1742-6596/2244/1/012038
Conference
International Conference on Ion Sources
Language
English
Published in
Journal of Physics : Conference Series
Is part of publication
ICIS2021 : 19th International Conference on Ion Sources
Citation
- George, A., Kalvas, T., Melanson, S., Dehnel, M., & Broderick, N. G. R. (2022). H- beam emittance analysis in a multicusp ion source. In ICIS2021 : 19th International Conference on Ion Sources (Article 012038). IOP Publishing. Journal of Physics : Conference Series, 2244. https://doi.org/10.1088/1742-6596/2244/1/012038
License
Copyright© the Authors, 2022.