dc.contributor.author | Martinella, Corinna | |
dc.contributor.author | Alia, R. G. | |
dc.contributor.author | Stark, R. | |
dc.contributor.author | Coronetti, Andrea | |
dc.contributor.author | Cazzaniga, C. | |
dc.contributor.author | Kastriotou, M. | |
dc.contributor.author | Kadi, Y. | |
dc.contributor.author | Gaillard, R. | |
dc.contributor.author | Grossner, U. | |
dc.contributor.author | Javanainen, Arto | |
dc.date.accessioned | 2021-03-11T10:39:40Z | |
dc.date.available | 2021-03-11T10:39:40Z | |
dc.date.issued | 2021 | |
dc.identifier.citation | Martinella, C., Alia, R. G., Stark, R., Coronetti, A., Cazzaniga, C., Kastriotou, M., Kadi, Y., Gaillard, R., Grossner, U., & Javanainen, A. (2021). Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies. <i>IEEE Transactions on Nuclear Science</i>, <i>68</i>(5), 634-641. <a href="https://doi.org/10.1109/TNS.2021.3065122" target="_blank">https://doi.org/10.1109/TNS.2021.3065122</a> | |
dc.identifier.other | CONVID_51871055 | |
dc.identifier.uri | https://jyx.jyu.fi/handle/123456789/74596 | |
dc.description.abstract | Accelerated terrestrial neutron irradiations were performed on different commercial SiC power MOSFETs with planar, trench and double-trench architectures. The results were used to calculate the failure cross-sections and the failure in time (FIT) rates at sea level. Enhanced gate and drain leakage were observed in some devices which did not exhibit a destructive failure during the exposure. In particular, a different mechanism was observed for planar and trench gate MOSFETs, the first showing a partial gate rupture with a leakage path mostly between drain and gate, similar to what was previously observed with heavy-ions, while the second exhibiting a complete gate rupture. The observed failure mechanisms and the post irradiation gate stress (PIGS) tests are discussed for the different technologies. | en |
dc.format.mimetype | application/pdf | |
dc.language | eng | |
dc.language.iso | eng | |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | |
dc.relation.ispartofseries | IEEE Transactions on Nuclear Science | |
dc.rights | CC BY 4.0 | |
dc.subject.other | silicon carbide | |
dc.subject.other | power MOSFETs | |
dc.subject.other | neutrons | |
dc.subject.other | single event effects | |
dc.subject.other | single event burnout | |
dc.subject.other | gate damage | |
dc.title | Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies | |
dc.type | article | |
dc.identifier.urn | URN:NBN:fi:jyu-202103111943 | |
dc.contributor.laitos | Fysiikan laitos | fi |
dc.contributor.laitos | Department of Physics | en |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | |
dc.type.coar | http://purl.org/coar/resource_type/c_2df8fbb1 | |
dc.description.reviewstatus | peerReviewed | |
dc.format.pagerange | 634-641 | |
dc.relation.issn | 0018-9499 | |
dc.relation.numberinseries | 5 | |
dc.relation.volume | 68 | |
dc.type.version | publishedVersion | |
dc.rights.copyright | © Authors, 2021 | |
dc.rights.accesslevel | openAccess | fi |
dc.relation.grantnumber | 721624 | |
dc.relation.grantnumber | 721624 | |
dc.relation.grantnumber | 4000124504/18/NL/KML/zx | |
dc.relation.projectid | info:eu-repo/grantAgreement/EC/H2020/721624/EU//RADSAGA | |
dc.subject.yso | elektroniikkakomponentit | |
dc.subject.yso | transistorit | |
dc.subject.yso | puolijohteet | |
dc.subject.yso | säteilyfysiikka | |
dc.subject.yso | neutronit | |
dc.format.content | fulltext | |
jyx.subject.uri | http://www.yso.fi/onto/yso/p9652 | |
jyx.subject.uri | http://www.yso.fi/onto/yso/p16104 | |
jyx.subject.uri | http://www.yso.fi/onto/yso/p18256 | |
jyx.subject.uri | http://www.yso.fi/onto/yso/p11069 | |
jyx.subject.uri | http://www.yso.fi/onto/yso/p15394 | |
dc.rights.url | https://creativecommons.org/licenses/by/4.0/ | |
dc.relation.doi | 10.1109/TNS.2021.3065122 | |
dc.relation.funder | European Commission | en |
dc.relation.funder | European Space Agency | en |
dc.relation.funder | Euroopan komissio | fi |
dc.relation.funder | European Space Agency | fi |
jyx.fundingprogram | MSCA Innovative Training Networks (ITN) | en |
jyx.fundingprogram | Others | en |
jyx.fundingprogram | MSCA Innovative Training Networks (ITN) | fi |
jyx.fundingprogram | Muut | fi |
jyx.fundinginformation | This work was supported by the European Space Agency ESA/ESTEC under Contract 4000124504/18/NL/KML/zk and by the European Union's Horizon 2020 research and innovation programme under the MSC grant agreement no. 721624. | |
dc.type.okm | A1 | |