Determination of tip profile for atomic force microscopy

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Show simple item record Tale, Camtu 2011-03-15T19:32:33Z 2011-03-15T19:32:33Z 2010
dc.identifier.uri en
dc.description.abstract In this study, atomic force microscopy (AFM) tip profile was introduced and examined on carbon nanotubes with varied diameters. Indeed, this technique is a promising candidate for imaging the objects at nano-scale under 10 nm due to the sharply apex of AFM’s tips . In addition, it could apply for biology samples such as DNA, proteins, cells, etc, which have larger sizes and more sensitive surfaces. Therefore, AFM tip shapes have been emerged and studied throughout. Subsequently, the image information has been analyzed in order to estimate the AFM tip profile. The image analysis has been characterized by many programs especially Surface program and Matlab. The purpose of our work is to present different approaches of examination AFM tips on 2 nm - 10 nm carbon nanotubes’ diameters.
dc.format.extent 74 s.
dc.language.iso eng
dc.rights This publication is copyrighted. You may download, display and print it for Your own personal use. Commercial use is prohibited. en
dc.rights Julkaisu on tekijänoikeussäännösten alainen. Teosta voi lukea ja tulostaa henkilökohtaista käyttöä varten. Käyttö kaupallisiin tarkoituksiin on kielletty. fi
dc.subject.other tip profile
dc.subject.other Tip profile
dc.subject.other image reconstruction
dc.subject.other atomic force microscopy
dc.subject.other apex
dc.subject.other atomic force microscopy
dc.title Determination of tip profile for atomic force microscopy
dc.type Book en
dc.identifier.urn URN:NBN:fi:jyu-201103151894
dc.subject.ysa nanotieteet
dc.type.dcmitype Text en
dc.type.ontasot Pro gradu fi
dc.type.ontasot Master’s thesis en
dc.contributor.tiedekunta Matemaattis-luonnontieteellinen tiedekunta fi
dc.contributor.tiedekunta Faculty of Mathematics and Science en
dc.contributor.laitos Fysiikan laitos fi
dc.contributor.laitos Department of Physics en
dc.contributor.yliopisto University of Jyväskylä en
dc.contributor.yliopisto Jyväskylän yliopisto fi
dc.contributor.oppiaine nanoScience

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